EUV emission spectra in collisions of multiply charged Sn ions with He and Xe

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 43, Issue 6, 2010, Pages

  Ohashi, H ^a   Suda, S ^a   Tanuma, H ^a   Fujioka, S ^b   Nishimura, H ^b   Sasaki, A ^c   Nishihara, K ^b  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE STATE; ELECTRON CAPTURE; EUV EMISSIONS; EXTREME ULTRAVIOLET EMISSION; GAS TARGETS; WAVELENGTH RANGES;

ATOMIC PHYSICS; EMISSION SPECTROSCOPY; IONS; ULTRAVIOLET DEVICES; ULTRAVIOLET SPECTROSCOPY; XENON;

TIN;

EID: 77949881197     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/43/6/065204     Document Type: Article

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