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Volumn 71, Issue 2, 2005, Pages
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Characterization of a vacuum-arc discharge in tin vapor using time-resolved plasma imaging and extreme ultraviolet spectrometry
b
ASML
(Netherlands)
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Author keywords
[No Author keywords available]
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Indexed keywords
CHIRAL;
DEFECT STRUCTURES;
SPLAY;
SUSPENDED FILMS;
CRYSTAL DEFECTS;
CRYSTAL ORIENTATION;
DISTORTION (WAVES);
ELASTICITY;
IONS;
LAPLACE TRANSFORMS;
LIGHT POLARIZATION;
MATHEMATICAL MODELS;
SUSPENSIONS (FLUIDS);
THIN FILMS;
VISCOSITY OF LIQUIDS;
SMECTIC LIQUID CRYSTALS;
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EID: 41349085634
PISSN: 15393755
EISSN: 15502376
Source Type: Journal
DOI: 10.1103/PhysRevE.71.026409 Document Type: Article |
Times cited : (28)
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References (8)
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