Charge exchange spectroscopy in Snq+(q = 6-15)-He collisions

Journal of Physics: Conference Series

Volumn 58, Issue 1, 2007, Pages 235-238

  Ohashi, H ^a   Tanuma, H ^a   Fujioka, S ^b   Nishimura, H ^b   Sasaki, A ^c   Nishihara, K ^b  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33947384596     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/58/1/050     Document Type: Article

References (15)

1. Bakshi V 2006 EUV Source for Lithography (Washington: SPIE press)
2. Svendsen W and O'Sullivan G 1994 Phys. Rev. A 50 3710
3. Kieft R E, Graloff K, van der Mullen M A J J and Banine V 2005 Phys. Rev. E 71 036402
4. White J, Hayden P, Dunne P, Cummings A, Murphy N, Sheridan P and O'Sullivan G 2005 J. Appl. Phys. 98 113301
5. Kieft R E, van der Mullen M A J J, Kroesen W M G, Banine V and Koshelev N K 2005 Phys. Rev. E 71 026409
6. Azarov V I and Joshi Y N 1993 J. Phys. B 26 3495
7. Tanuma H, Matsumoto J, Nishide T, Shiromaru H and Kobayashi N 2001 J. Chin. Chem. Soc. 48 389
8. Andersson H, Astner G and Cederquist H 1988 J. Phys. B 21 L187
9. Selberg N, Biedermann C and Cederquist H 1996 Phys. Rev. A 54 4127
10. Vancura J, Marchetti J V, Perotti J J and Kostroun O V 1993 Phys. Rev. A 47 3758
11. Justiniano E, Cocke L C, Gray J T, Dubois R, Can C, Waggoner W, Schmidt-Boecking R and Ingwersen H 1984 Phys. Rev. A 29 1088
12. Tanuma H, Ohashi H, Shibuya E, Kobayashi N, Okuno T, Fujioka S, Nishimura H and Nishihara K 2005 Nucl. Instrum. Meth. B 235 126
13. Koike F, Azuma Y, Hasegawa S, Nagata T and Nishihara K 2005 J. Electron. Spec. Relat. Phenom. 144-147 1227
14. Koike F and Fritzsche S 2006 Radiat. Phys. Chem. in press
15. O'Sullivan G and Faukner R 1994 Opt. Eng. 33 3978