Broadband anti-reflection and enhanced field emission from catalyst-free grown small-sized ITO nanowires at a low temperature

Acta Materialia

Volumn 58, Issue 8, 2010, Pages 3068-3072

  Wan, Neng ^a   Xu, Jun ^a   Chen, Guran ^a   Gan, Xinhui ^a   Guo, Sihua ^a   Xu, Ling ^a   Chen, Kunji ^a  

^a NANJING TECH UNIVERSITY   (China)

Author keywords

Anti reflection; e Beam evaporation; Field emission; ITO; Nanostructure

Indexed keywords

ANTI-REFLECTION; BODY-CENTERED CUBIC CRYSTALS; CATALYST-FREE; E BEAM EVAPORATION; ELECTRON BEAM EVAPORATION; ENHANCED FIELD EMISSION; FILM SURFACES; GROWTH MECHANISMS; HIGH FIELD; INDIUM TIN OXIDE; ITO NANOWIRES; LOW TEMPERATURES; NANOWIRE FILMS; REFRACTION INDEX; TURN-ON ELECTRIC FIELD; VAPOR-SOLID PROCESS;

CATALYSTS; CRYSTAL STRUCTURE; ELECTRIC FIELDS; ELECTRIC PROPERTIES; ELECTRON BEAMS; EVAPORATION; FIELD EMISSION; NANOWIRES; REFLECTION; SCANNING ELECTRON MICROSCOPY; TIN; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; VAPORS;

ELECTRIC WIRE;

EID: 77949656338     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.01.041     Document Type: Article

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