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Volumn 18, Issue 5, 2010, Pages 5229-5244

Dual-frequency pattern scheme for high-speed 3-D shape measurement

Author keywords

[No Author keywords available]

Indexed keywords

SIGNAL NOISE MEASUREMENT; TABLE LOOKUP;

EID: 77749304272     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.005229     Document Type: Article
Times cited : (345)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.