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Volumn 44, Issue 35, 2005, Pages 7515-7521

Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; INTERFEROMETRY; LASERS; PHASE SHIFT; PROFILOMETRY;

EID: 30844454700     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.007515     Document Type: Article
Times cited : (37)

References (39)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.