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Volumn 107, Issue 4, 2010, Pages

Study of metal/ZnO based thin film ultraviolet photodetectors: The effect of induced charges on the dynamics of photoconductivity relaxation

(3) Yadav, Harish Kumar a Sreenivas, K a Gupta, Vinay a

a UNIVERSITY OF DELHI (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIER TRANSFER; DEFECT CENTERS; EFFECT OF OXYGEN; FREE CARRIERS; INDUCED CHARGES; METAL LAYER; OXYGEN AFFINITY; PHOTORESPONSES; PURE ZNO; REACTIVE GAS MIXTURES; RESPONSIVITY; RF-MAGNETRON SPUTTERING; SEMICONDUCTING LAYER; SURFACE CONDUCTIVITY; ULTRA-THIN; ULTRA-VIOLET PHOTODETECTORS; ZNO; ZNO STRUCTURES; ZNO THIN FILM;

CHARGE CARRIERS; CHROMIUM; COPPER; ELECTRON MOBILITY; HETEROJUNCTIONS; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL FILMS; OPTOELECTRONIC DEVICES; OXYGEN; PHOTOCONDUCTIVITY; PHOTODETECTORS; PRESSURE EFFECTS; SEMICONDUCTING FILMS; THIN FILM DEVICES; THIN FILMS; TIN; ZINC OXIDE;

GOLD;

EID: 77749264649 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3291133 Document Type: Article

Times cited : (76)

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