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Volumn 96, Issue 8, 2010, Pages

Coherent backscattering in optical microring resonators

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT BACKSCATTERING; GROUP INDEX; LIMITING FACTORS; NANOWAVEGUIDES; OPTICAL MICRORING RESONATOR; QUALITY FACTORS; RING RESONATOR; ROUND TRIP; SIDEWALL ROUGHNESS; SILICON ON INSULATOR;

EID: 77749233808     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3330894     Document Type: Article
Times cited : (70)

References (12)
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    • Xu, Q.1    Schmidt, B.2    Pradhan, S.3    Lipson, M.4
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    • 0030289401 scopus 로고    scopus 로고
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    • Ladouceur, F.1    Poladian, L.2
  • 8
    • 17544367675 scopus 로고    scopus 로고
    • Beyond the Rayleigh scattering limit in high-Q silicon microdisks: Theory and experiment
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  • 9
    • 5244323908 scopus 로고    scopus 로고
    • OPLEDP 0146-9592. 10.1364/OL.22.000004
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    • Little, B.E.1    Laine, J.-P.2    Chu, S.T.3
  • 11
    • 38649115345 scopus 로고    scopus 로고
    • Fabrication of low-loss photonic wires in silicon-on-insulator using hydrogen silsesquioxane electron-beam resist
    • DOI 10.1049/el:20082985
    • M. Gnan, S. Thoms, D. S. Macintyre, R. M. De La Rue, and M. Sorel, Electron. Lett. ELLEAK 0013-5194 44, 115 (2008). 10.1049/el:20082985 (Pubitemid 351169144)
    • (2008) Electronics Letters , vol.44 , Issue.2 , pp. 115-116
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.