Complementary formal approaches for dependability analysis

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2009, Pages 331-339

  Baarir, Souheib ^a   Braunstein, Cécile ^a   Clavel, Renaud ^b   Encrenaz, Emmanuelle ^a   Ilié, Jean Michel ^a   Leveugle, Régis ^b   Mounier, Isabelle ^a   Pierre, Laurence ^b   Poitrenaud, Denis ^a  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEPENDABILITY ANALYSIS; DESIGN FLOWS; FORMAL APPROACH; FORMAL TECHNIQUES; NEW APPROACHES; ROBUSTNESS EVALUATION; SELF REPAIRING; SELF-HEALING; SOFT ERROR; SOFT ERROR RATE;

DEFECTS; DIGITAL INTEGRATED CIRCUITS; ERROR CORRECTION; FAULT TOLERANT COMPUTER SYSTEMS; MICROPROCESSOR CHIPS; PROBABILITY DENSITY FUNCTION; QUALITY ASSURANCE;

FAULT TOLERANCE;

EID: 77649288732     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2009.21     Document Type: Conference Paper

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