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Volumn 493, Issue 1-2, 2010, Pages 179-185
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Studies on growth and characterization of CdS1-xSex (0.0 ≤ x ≤ 1.0) alloy thin films by spray pyrolysis
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Author keywords
Cadmium compounds; Electrical properties; Optical properties; Semiconducting II VI materials; X ray diffraction
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Indexed keywords
ABSORPTION COEFFICIENTS;
AMORPHOUS GLASS;
BAND GAP ENERGY;
CDS;
COATED GLASS SUBSTRATES;
COMPOSITION PARAMETERS;
COST EFFECTIVE;
DEPOSITION PARAMETERS;
ELECTRICAL PROPERTIES;
ELECTRICAL PROPERTY;
HEXAGONAL STRUCTURES;
LATTICE PARAMETERS;
OPTICAL ABSORPTION STUDIES;
OPTICAL AND ELECTRICAL PROPERTIES;
PHOTOELECTROCHEMICAL TECHNIQUE;
POLYCRYSTALLINE;
POLYCRYSTALLINE TEXTURES;
RESISTIVITY MEASUREMENT;
SEM;
SEMICONDUCTING BEHAVIOR;
SEMICONDUCTING II-VI MATERIALS;
SMOOTH SURFACE;
SPRAY-PYROLYSIS TECHNIQUES;
X-RAY DIFFRACTION STUDIES;
ABSORPTION;
AMORPHOUS FILMS;
CADMIUM;
CADMIUM COMPOUNDS;
CADMIUM SULFIDE;
DATA STORAGE EQUIPMENT;
DIFFRACTION;
GLASS;
OPTICAL PROPERTIES;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTING SELENIUM COMPOUNDS;
SEMICONDUCTOR GROWTH;
SPRAY PYROLYSIS;
STOICHIOMETRY;
THIN FILMS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ELECTRIC PROPERTIES;
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EID: 77549084062
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.12.044 Document Type: Article |
Times cited : (41)
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References (34)
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