Photoinduced structural dynamics of polar solids studied by femtosecond X-ray diffraction

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 66, Issue 2, 2010, Pages 168-178

  Elsaesser, Thomas ^a   Woerner, Michael ^a  

^a MAX BORN INSTITUT   (Germany)

Author keywords

Charge density maps; Charge transfer processes; Dynamical structural science; Femtosecond X ray diffraction; Structural dynamics; Superlattice structures

Indexed keywords

EID: 77249128562     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767309048181     Document Type: Article

References (43)

1. Ahmed, S., Shamah, A. M., Kamel, R. & Badr, Y. (1987). Phys. Status Solidi. A, 99, 131-140.
2. Als-Nielsen, J. & McMorrow, D. (2001). Elements of Modern X-Ray Physics. New York: Wiley.
3. Bargheer, M., Zhavoronkov, N., Bruch, R., Legall, H., Stiel, H., Woerner, M. & Elsaesser, T. (2005). Appl. Phys. B, 80, 715-719.
4. Bargheer, M., Zhavoronkov, N., Gritsai, Y., Woo, J. C., Kim, D. S., Woerner, M. & Elsaesser, T. (2004). Science, 306, 1771-1773.
5. Bargheer, M., Zhavoronkov, N., Woerner, M. & Elsaesser, T. (2006). ChemPhysChem, 7, 783-792.
6. Beaud, P., Johnson, S. L., Streun, A., Abela, R., Abramsohn, D., Grolimund, D., Krasniqi, F., Schmidt, T. Schlott, V. & Ingold, G. (2007). Phys. Rev. Lett. 99, 174801.
7. Braun, M., Korff-Schmising, C. von, Kiel, M., Zhavoronkov, N., Dreyer, J., Bargheer, M., Elsaesser, T., Root, C., Schrader, T. E., Gilch, P., Zinth, W. & Woerner, M. (2007). Phys. Rev. Lett. 98, 248301.
8. Cavalleri, A., Wall, S., Simpson, C., Statz, E., Ward, D. W., Nelson, K. A., Rini, M. & Schoenlein, R. W. (2006). Nature (London), 442, 664-666.
9. Collet, E., Cointe, M. B. L., Lorenc, M. & Cailleau, H. (2008). Z. Kristallogr. 223, 272-282.
10. Colvard, C., Gant, T. A., Klein, M. V.,Merlin, R., Fischer, R.,Morkoc, H. & Gossard, A. C. (1985). Phys. Rev. B, 31, 2080-2091.
11. Coppens, P. (1997). X-ray Charge Densities and Chemical Bonding. New York: Oxford University Press.
12. Corkum, P., Jonas, D., Miller, R. J. D. &Weiner, A. M. (2007). Editors. Ultrafast Phenomena XV. Berlin: Springer.
13. Esaki, L. & Tsu, R. (1970). IBM J. Dev. 14, 61-65.
14. Frey, W., Root, C., Gilch, P. & Braun, M. (2004). Z. Kristallogr. New Cryst. Struct. 219, 291-292.
15. Grabowski, Z. R., Rotkiewicz, K. & Rettig, W. (2003). Chem. Rev. 103, 3899-4032.
16. Jiang, Y., Lee, T., Li, W., Ketwaroo, G. & Rose-Petruck, C. G. (2002). Opt. Lett. 27, 963-965.
17. Khan, S., Holldack, K., Kachel, T., Mitzner, R. & Quast, T. (2006). Phys. Rev. Lett. 97, 074801.
18. Kmetec, J. D., Gordon III, C. L., Macklin, J. J., Lemoff, B. E., Brown, G. S. & Harris, S. E. (1991). Phys. Rev. Lett. 68, 1527-1530.
19. Korff Schmising, C. von, Bargheer, M., Kiel, M., Zhavoronkov, N., Woerner, M., Elsaesser, T., Vrejoiu, I., Hesse, D. & Alexe, M. (2006). Phys. Rev. B, 73, 212202.
20. Korff Schmising, C. von, Bargheer, M., Kiel, M., Zhavoronkov, N., Woerner, M., Elsaesser, T., Vrejoiu, I., Hesse, D. & Alexe, M. (2007a). Phys. Rev. Lett. 98, 257601.
21. Korff Schmising, C. von, Bargheer, M., Kiel, M., Zhavoronkov, N., Woerner, M., Elsaesser, T., Vrejoiu, I., Hesse, D. & Alexe, M. (2007b). Appl. Phys. B, 88, 1-4.
22. Korff Schmising, C. von, Harpoeth, A., Zhavoronkov, N., Ansari, Z., Aku-Leh, C., Woerner, M., Elsaesser, T., Bargheer, M., Schmidbauer, M., Vrejoiu, I., Hesse, D. & Alexe, M. (2008). Phys. Rev. B, 78, 060404(R).
23. Korn, G., Thoss, A., Stiel, H., Vogt, U., Richardson, M., Elsaesser, T. & Faubel, M. (2002). Opt. Lett. 27, 866-868.
24. Krost, A., Bauer, G. & Woitok, J. (1996). Optical Characterization of Epitaxial Semiconductor Layers, edited by G. Bauer & W. Richter, pp. 287-391. Berlin: Springer.
25. Lichtensteiger, C., Triscone, J. M., Junquera, J. & Ghosez, P. (2005). Phys. Rev. Lett. 94, 047603.
26. Lindenberg, A. M. et al. (2005). Science, 308, 392-395.
27. Rischel, C., Rousse, A., Uschmann, I., Albouy, P. A., Geindre, J. P., Audebert, P., Gauthier, J. C., Förster, E., Martin, J. L. & Antonetti, A. (1997). Nature (London), 390, 490-492.
28. Root, C. (2006). PhD thesis, University of Munich, Germany.
29. Rousse, A., Rischel, C., Fourmaux, S., Uschmann, I., Sebban, S., Grillon, G., Balcou, P., Förster, E., Geindre, J. P., Audebert, P., Gauthier, J. C. & Hulin, D. (2001). Nature (London), 410, 65-68.
30. Rousse, A., Rischel, C. & Gauthier, J. C. (2001). Rev. Mod. Phys. 73, 17-31.
31. Sanjurjo, J. A., Lopez-Cruz, E. & Burns, G. (1983). Solid State Commun. 48, 221-224.
32. Schlemper, E. O. & Hamilton, W. C. (1966). J. Chem. Phys. 44, 4498-4509.
33. Schoenlein, R. W., Chattopadhyay, S., Chong, H. H. W., Glover, T. E., Heimann, P. A., Shank, C. V., Zholents, A. A. & Zolotorev, M. S. (2000). Science, 287, 2237-2239.
34. Service, R. F. (2002). Science, 298, 1356-1358.
35. Siders, C. W., Cavalleri, A., Sokolowski-Tinten, K., Toth, C., Guo, T., Kammler, M., von Hoegen, M. H., Wilson, K. R., von der Linde, D. & Barty, C. P. J. (1999). Science, 286, 1340-1342.
36. Sokolowski-Tinten, K., Blome, C., Blums, J., Cavalleri, A., Dietrich, C., Tarasevitch, A., Uschmann, I., Förster, E., Kammler, M., Hornvon-Hoegen, M. & von der Linde, D. (2003). Nature (London), 422, 287-289.
37. Techert, S. & Zachariasse, K. A. (2004). J. Am. Chem. Soc. 126, 5593-5600.
38. Warren, B. E. (1969). X-Ray Diffraction. New York: Dover.
39. Welberry, T. R. & Butler, B. D. (1995). Chem. Rev. 95, 2369-2403.
40. Wolfram, T. & Ellialtioglu, S. (2006). Electronic and Optical Properties of d-Band Perovskites. Cambridge University Press.
41. Zamponi, F., Ansari, Z., von Korff Schmising, C., Rothhardt, P., Zhavoronkov, N., Woerner, M., Elsaesser, T., Bargheer, M., Trobitzsch-Ryll, T. & Haschke, M. (2009). Appl. Phys. A, 96, 51-58.
42. Zhavoronkov, N., Gritsai, Y., Bargheer, M., Woerner, M., Elsaesser, T., Zamponi, F., Uschmann, I. & Förster, E. (2005). Opt. Lett. 30, 1737-1739.
43. Zwan, G. van der & Hynes, J. T. (1985). J. Phys. Chem. 89, 4181-4188.