Tracking the motion of charges in a terahertz light field by femtosecond X-ray diffraction

Nature

Volumn 442, Issue 7103, 2006, Pages 664-666

  Cavalleri, A ^a,b   Wall, S ^a   Simpson, C ^a   Statz, E ^c   Ward, D W ^c   Nelson, K A ^c   Rini, M ^d   Schoenlein, R W ^d  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; LATTICE VIBRATIONS; LIGHT PROPAGATION; OSCILLATIONS; RAMAN SCATTERING; X RAY DIFFRACTION;

ELECTRO-OPTIC SAMPLING; FEMTOSECOND X-RAY DIFFRACTION; LITHIUM TANTALATE; TERAHERTZ RADIATION;

LIGHT;

LITHIUM;

ELECTRICAL PROPERTY; ION; LIGHT SCATTERING; OPTICAL PROPERTY; POLARIZATION; X-RAY DIFFRACTION;

AMPLITUDE MODULATION; ARTICLE; ELECTRIC FIELD; LIGHT; MOTION; OPTICAL ROTATION; OSCILLATION; PRIORITY JOURNAL; RADIATION SCATTERING; SAMPLING; SOLID; X RAY DIFFRACTION;

EID: 33747062124     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature05041     Document Type: Article

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