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Volumn 527, Issue 10-11, 2010, Pages 2684-2692

Semi-automated characterization of the γ′ phase in Ni-based superalloys via high-resolution backscatter imaging

Author keywords

Electron microscopy; Image analysis; Microstructure; Nickel based superalloys; Segmentation

Indexed keywords

AUTOMATION; BACKSCATTERING; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE SEGMENTATION; NICKEL; NICKEL ALLOYS; SUPERALLOYS;

EID: 77249099878     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2009.12.037     Document Type: Article
Times cited : (38)

References (31)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.