Imaging and characterization of fine γ′ precipitates in a commercial nickel-base superalloy

Ultramicroscopy

Volumn 103, Issue 1, 2005, Pages 83-93

  Sarosi, P M ^a   Viswanathan, G B ^a   Whitis, D ^b   Mills, M J ^a  

^a Ohio State University   (United States)

^b GE AVIATION   (United States)

Author keywords

Nickel base superalloy; Small precipitates

Indexed keywords

CHARACTERIZATION; ELECTRON ENERGY LOSS SPECTROSCOPY; IONIZATION; MATHEMATICAL MODELS; MECHANICAL PROPERTIES; NICKEL; SUPERALLOYS; TRANSMISSION ELECTRON MICROSCOPY; VOLUME FRACTION;

CONTRAST-TO-NOISE RATIO; DATASETS; IMAGING FILTER PARAMETERS; SIZE DISTRIBUTIONS;

IMAGING TECHNIQUES;

ALLOY; NICKEL COMPLEX;

CALIBRATION; COMPUTER MODEL; CONFERENCE PAPER; EMPIRICISM; ENGINEERING; IMAGING SYSTEM; IONIZATION; PRECIPITATION; PREDICTION; SIGNAL NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY; VALIDATION PROCESS;

EID: 14944354829     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.11.014     Document Type: Conference Paper

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