Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 82, Issue 13, 2002, Pages 2575-2589

  Fruhstorfer, B ^a   Mohles, V ^a   Reichelt, R ^a   Nembach, E ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AGENTS; ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; NICKEL ALLOYS; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SUPERALLOYS; SURFACE PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; VOLUME FRACTION;

POLISHING AGENT; QUANTITATIVE CHARACTERIZATION; SPHERICAL PARTICLES;

PARTICLES (PARTICULATE MATTER);

EID: 0037057184     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610208240053     Document Type: Article

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