Characterization of microstructural fluctuations in Waspaloy exposed to 760 °c for times up to 2500 h

Electrochimica Acta

Volumn 51, Issue 8-9, 2006, Pages 1873-1880

  Kelekanjeri, V Siva Kumar G ^a   Gerhardt, Rosario A ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

Extended thermal exposure; Impedance spectroscopy; Microstructural fluctuations; Nickel base superalloy; X ray diffraction

Indexed keywords

ELECTRIC IMPEDANCE; ENERGY DISPERSIVE SPECTROSCOPY; MICROSTRUCTURE; NICKEL; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EXTENDED THERMAL EXPOSURE; IMPEDANCE SPECTROSCOPY; MICROSTRUCTURAL FLUCTUATIONS;

SUPERALLOYS;

EID: 30744451197     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.02.099     Document Type: Conference Paper

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