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Volumn 43, Issue 8, 2010, Pages

Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM ZINC TELLURIDES; CDZNTE DETECTORS; CHARGE COLLECTION PROPERTIES; CHARGE TRANSPORT; DIRECT MEASUREMENT; ELECTRIC FIELD DISTRIBUTIONS; ELECTRIC FIELD PROFILES; IN-SITU; INDUCED CURRENT PULSE; INTERNAL ELECTRIC FIELDS; LOW TEMPERATURE CONDITIONS; LOW TEMPERATURES; METAL CONTACTS; POCKELS; POCKELS EFFECT; ROOM TEMPERATURE; SPACE CHARGES; THEORETICAL MODELS; TRANSIENT CURRENT TECHNIQUE; WORKING CONDITIONS; X RAY IRRADIATION;

EID: 77149120745     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/8/085102     Document Type: Article
Times cited : (23)

References (17)
  • 17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.