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Volumn 43, Issue 8, 2010, Pages
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Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect
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Author keywords
[No Author keywords available]
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Indexed keywords
CADMIUM ZINC TELLURIDES;
CDZNTE DETECTORS;
CHARGE COLLECTION PROPERTIES;
CHARGE TRANSPORT;
DIRECT MEASUREMENT;
ELECTRIC FIELD DISTRIBUTIONS;
ELECTRIC FIELD PROFILES;
IN-SITU;
INDUCED CURRENT PULSE;
INTERNAL ELECTRIC FIELDS;
LOW TEMPERATURE CONDITIONS;
LOW TEMPERATURES;
METAL CONTACTS;
POCKELS;
POCKELS EFFECT;
ROOM TEMPERATURE;
SPACE CHARGES;
THEORETICAL MODELS;
TRANSIENT CURRENT TECHNIQUE;
WORKING CONDITIONS;
X RAY IRRADIATION;
CADMIUM;
CADMIUM ALLOYS;
CADMIUM COMPOUNDS;
CADMIUM TELLURIDE;
DETECTORS;
ELECTRIC FIELD MEASUREMENT;
ELECTRIC FIELDS;
ELECTRIC PROPERTIES;
IRRADIATION;
METAL WORKING;
RADIATION;
ZINC;
ELECTRIC SENSING DEVICES;
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EID: 77149120745
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/43/8/085102 Document Type: Article |
Times cited : (23)
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References (17)
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