Investigation on microstructure, dielectric and impedance properties of Sr1-xBi2+(2/3)x(VxTa1-x) 2O9 [x = 0, 0.1 and 0.2] ceramics

Journal of Alloys and Compounds

Volumn 492, Issue 1-2, 2010, Pages 642-648

  Sridarane, R ^a   Subramanian, S ^b   Janani, N ^b   Murugan, R ^b  

^a Perunthalaivar Kamarajar Institute of Engineering and Technology   (India)

^b PONDICHERRY ENGINEERING COLLEGE   (India)

Author keywords

Aurivillius structure; Ceramics; Dielectric; Impedance

Indexed keywords

AURIVILLIUS STRUCTURE; CERAMIC SAMPLES; DIELECTRIC CONSTANTS; IMPEDANCE PROPERTIES; MICRO-STRUCTURAL; SCANNING ELECTRON MICROSCOPE; SEM; SPECTROSCOPIC TECHNIQUE; XRD;

CERAMIC MATERIALS; CURIE TEMPERATURE; GRAIN GROWTH; LATTICE CONSTANTS; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

TANTALUM;

EID: 76849088911     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.11.201     Document Type: Article

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