Dielectric properties of Sr1+XBi 2-(2/3)X(VXTa1-X) 2O9 [X = 0, 0.1 and 0.2] ceramics

Physica B: Condensed Matter

Volumn 357, Issue 3-4, 2005, Pages 439-444

  Sridarane, R ^a   Kalaiselvi, B J ^a   Akila, B ^a   Subramanian, S ^a   Murugan, Ramaswamy ^a  

^a PONDICHERRY ENGINEERING COLLEGE   (India)

Author keywords

Aurivillius family layered oxides; Ceramics; Dielectric property

Indexed keywords

BISMUTH; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; NANOSTRUCTURED MATERIALS; PERMITTIVITY; PEROVSKITE; POLARIZATION; X RAY DIFFRACTION;

AURIVILLIUS FAMILY LAYERED OXIDES; CONSTANT MAXIMUM SHIFTS; DETECTABLE SECONDARY PHASE; FERROELECTRIC RANDOM ACCESS MEMORIES (FERAM);

STRONTIUM;

EID: 14544299559     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.12.011     Document Type: Article

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