SrBi2 (Ta0.5 Nb0.5)2 O9:W thin films obtained by chemical solution deposition: Morphological and ferroelectric characteristics

Journal of Alloys and Compounds

Volumn 461, Issue 1-2, 2008, Pages 326-330

  Amsei Junior N L ^a   Simoes A Z ^a   Cavalcante, L S ^b   Moura, F ^a   Longo, E ^a   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

Atomic force microscopy; Chemical synthesis; Dielectric response; Ferroelectrics; Thin films

Indexed keywords

TUNGSTEN;

EID: 44849088810     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.06.115     Document Type: Article

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