Modelling the interaction forces between an ideal measurement surface and the stylus tip of a novel vibrating micro-scale CMM probe

IFIP Advances in Information and Communication Technology

Volumn 315, Issue , 2010, Pages 131-138

  Claverley, J D ^a   Georgi, A ^b   Leach, R K ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

Author keywords

Micro CMM probe; Surface interaction forces

Indexed keywords

ANALYTICAL MODEL; INTERACTION FORCES; MICRO-SCALES; NANO SCALE; PROBE SURFACE; SURFACE FORCES; SURFACE INTERACTIONS; THREE AXES; THREE-AXIS; VIBRATION AMPLITUDE; VIBRATION EXPERIMENT;

COMPUTER SIMULATION; COORDINATE MEASURING MACHINES; MATHEMATICAL MODELS; POSITION CONTROL;

PROBES;

EID: 76749146987     PISSN: 18684238     EISSN: None     Source Type: Book Series    
DOI: 10.1007/978-3-642-11598-1_15     Document Type: Article

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