Data learning techniques and methodology for Fmax prediction

Proceedings - International Test Conference

Volumn , Issue , 2009, Pages

  Chen, Janine ^a   Wang, Li C ^a   Chang, Po Hsien ^a   Zeng, Jing ^b   Yu, Stanley ^b   Mateja, Michael ^b  

^a University of California   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY MEASUREMENTS; FREQUENCY DATA; HIGH-PERFORMANCE MICROPROCESSORS; LEARNING APPROACH; LEARNING TECHNIQUES; PREDICTION MODEL; STRUCTURAL TESTS;

MATHEMATICAL MODELS; TEST FACILITIES;

LEARNING ALGORITHMS;

EID: 76549123438     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2009.5355620     Document Type: Conference Paper

References (7)

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2. Jing Zeng, et al. On correlating structural tests with functional tests for speed binning of high performance design. ITC, 2004, pp. 31-37.
3. Trevor Hastie, Robert Tibshirani, and Jerome Friedman. The Elements of Statistical Learning - Date Mining, Inference, and Prediction. Springer Series in Statistics, 2001
4. Bernhard Schlkopf, and Alexander J. Smola. Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond. The MIT Press, 2001.
5. Carl E. Rasmussen and Christopher K. I. Williams. Gaussian Processes for Machine Learning. The MIT Press, 2005.
6. P. Bastani, et al. Speedpath prediction based on learning from a small set of examples. Proc. DAC, 2008, pp. 217-222.
7. Sean H. Wu, D. Drmanac, Li-C. Wang. A Study of Outlier Analysis Techniques for Delay Testing. ITC, 2008.