Power factor measurements of bismuth telluride nanowires grown by pulsed electrodeposition

Physica Status Solidi - Rapid Research Letters

Volumn 4, Issue 1-2, 2010, Pages 43-45

  Lee, Jongmin ^a   Kim, Yunseok ^a   Cagnon, Laurent ^b   Gösele, Ulrich ^a   Lee, Jaeyoung ^c   Nielsch, Kornelius ^d  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c Gwangju Institute of Science and Technology (GIST)   (South Korea)

^d UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA MATRIX; AMBIENT CONDITIONS; ATOMIC FORCE MICROSCOPES; AU ELECTRODES; BISMUTH TELLURIDE; ELECTRICAL CONDUCTIVITY; ELECTRICAL RESISTANCES; MAXIMUM POWER FACTOR; NANOWIRE ARRAYS; OXIDE FORMATION; POWER FACTORS; PULSED ELECTRODEPOSITION; THERMOPOWER MEASUREMENTS;

BISMUTH; ELECTRIC CONDUCTIVITY; ELECTRIC POWER FACTOR; ELECTRODEPOSITION; GOLD COATINGS; NANOWIRES; THERMOANALYSIS;

ELECTRIC WIRE;

EID: 76449099277     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200903368     Document Type: Article

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