Microstructure and electrical properties of RuO2-CeO2 composite thin films

Thin Solid Films

Volumn 518, Issue 10, 2010, Pages 2801-2807

  Nowakowski, P ^a   Villain, S ^a   Aguir, K ^c   Guerin J ^c   Kopia, A ^b   Kusinski, J ^b   Guinneton, F ^a   Gavarri, J R ^a  

^a UNIVERSITÉ DE TOULON   (France)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^c AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

composite thin films; electrical percolation; electrical properties; electron microscopy; Ruthenium cerium dioxides; thin films

Indexed keywords

CERIUM DIOXIDES; COMPOSITE THIN FILMS; ELECTRICAL PERCOLATION; ELECTRICAL PROPERTIES; ELECTRICAL PROPERTY;

CERIUM; ELECTRIC CONDUCTIVITY; ELECTRIC NETWORK ANALYSIS; PELLETIZING; RUTHENIUM; RUTHENIUM ALLOYS; RUTHENIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SOLVENTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION;

COMPOSITE FILMS;

EID: 76249121169     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.08.034     Document Type: Article

References (37)

1. Frohlich K., Machajdik D., Cambel V., Kostic I., and Pignard S. J. Cryst. Growth 235 (2002) 377
2. Frolich K., Cambel V., and Machajdik M. Mater. Sci. Semicond. Process. 5 (2003) 173
3. Jalenkovic V.E., Tong K.Y., Cheung W.Y., and Wong S.P. Microelectron. Eng. 71 (2004) 237
4. Huang J.H., and Chen J.S. Thin Solid Films 382 (2001) 139
5. Mogensen M., Sammes N.M., and Tompsett G.A. Solid State Ionics 129 (2000) 63
6. Over H., and Muhler M. Prog. Surf. Sci. 72 (2003) 3
7. Reuter K., and Scheffler M. Phys. Rev. Lett. 90 (2003) 1
8. Zen J.-M., Kumar A.S., and Chen J.-Ch. J. Mol. Catal., A Chem. 165 (2001) 177
9. Oh S., Park C., and Park C. Thin Solid Films 359 (2000) 118
10. Jiao K.L., Jia Q.X., and Anderson W.A. Thin Solid Films 227 (1993) 59
11. Armelao L., Barreca D., and Moraru B. J. Non-Cryst. Solids 316 (2003) 364
12. Liao P.C., Mar S.Y., Ho W.S., Huang Y.S., and Tiong K.K. Thin Solid Films 287 (1996) 74
13. Frohlich K., Hooker J.C., Francuilli M., Dimoulas A., and Roozeboom F. Mater. Sci. Eng. B 109 (2004) 117
14. Kim J.J., Jung D.H., and Kim M.S. Thin Solid Films 409 (2002) 28
15. Wendt S., Seitsonen A.P., and Over H. Catal. Today 85 (2003) 167
16. Wang J., Fan C.Y., Jacobi K., and Ertl G. J. Phys. Chem. B 106 (2002) 5476
17. Wodiunig S., Patsis V., and Comninellis C. Solid State Ionics 136/137 (2000) 813
18. Paulus U.A., Wang Y., Bonzel H.P., Jacobi K., and Ertl G. Surf. Sci. 566/568 (2004) 989
19. Villain S., Leroux Ch., Musso J., Gavarri J.R., Kopia A., Klimczak M., and Kusinski J. J. Meta-stable Nanocryst. Mater. 12 (2002) 59
20. Saitzek S., Villain S., and Gavarri J.R. Mater. Sci. Forum, Trans. Tech. Publ. 513 (2006) 1
21. Chmielowska M., Kopia A., Leroux C., Saitzek S., Kusinski J., and Gavarri J.-R. Solid State Phenom. 99/100 (2004) 235
22. Nowakowski P., Villain S., Kopia A., Suliga I., and Gavarri J.R. Appl. Surf. Sci. 254 (2008) 5675
23. Nowakowski P., Dallas J.P., Villain S., Kopia A., and Gavarri J.R. J. Solid State Chem. 181 (2008) 1005
24. Grimaldi C., Maeder T., Ryser P., and Strassler S. J. Phys., D, Appl. Phys. 36 (2003) 1341
25. Nicoloso N., LeCorre-Frisch A., Maier J., and Brook R.J. Solid State Ionics 75 (1995) 211
26. N. Nicoloso, A. LeCorre-Frisch, M. Maglione, J. Maier, J.C. Niepce, R.J. Brook, Electroceramics III, Maubeuge, France, Proceeding of Electroceramics III (1994) 135.
27. Simonnet C., Grandjean A., and Phalippou J. J. Nucl. Mater. 336 (2005) 243
28. Simonnet C., Grandjean A., and Malki M. J. Non-Cryst. Solids 351 (2005) 1611
29. Clerc J.P., Giraud G., Laugier J.M., and Luck J.M. Adv. Phys. 39 (1990) 191
30. Thommerel E., Valmalette J.C., Musso J., Villain S., Gavarri J.R., and Spada D. Mater. Sci. Eng. A 328 1/2 (2002) 68
31. Roisnel T., and Rodriguez-Carvajal J. In: Delhez R., and Mittenmeijer E.J. (Eds). Proceedings of the Seventh European Powder Diffraction Conference (EPDIC 7) (2000) 118
32. Rodríguez-Carvajal J. Abstracts of the Satellite Meeting on Powder Diffraction of the XV (1990), Congress of the International Union of Crystallography, Toulouse, France 127
33. Rodriguez-Carvajal J., and Commission of Powder Diffraction (IUCr). Newsletter 26 (2001) 12
34. Rodriguez-Carvajal J. IV European Powder Diffraction Conference, Chester (England), July 10-14, INV02 (1995)
35. Williamson G.K., and Hall W.H. Acta Metall. 1 (1953) 22
36. Johnson B.Y., Edington J., Williams A., and O'Keefe M.J. Mater. Charact. 54 (2005) 41
37. Vionnet-Menot S., Grimaldi C., Maeder T., Ryser P., and Strässler S. J. Eur. Ceram. Soc. 25 (2005) 2129