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Volumn 268, Issue 3-4, 2010, Pages 273-276
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Effect of antimony incorporation on structural properties of CuInS2 crystals
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Author keywords
Chalcopyrite; CIS; Crystals; Doping; Structural properties
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Indexed keywords
ATOMIC PERCENT;
CHALCOPYRITE;
CIS;
DIFFRACTION PEAKS;
EMISSION PEAKS;
HORIZONTAL BRIDGMAN METHOD;
P-TYPE CONDUCTIVITY;
PL MEASUREMENTS;
PL SPECTRA;
PREFERRED ORIENTATIONS;
SB DOPING;
SB-DOPED;
SEM;
X-RAY DIFFRACTION DATA;
ANTIMONY;
ATOMIC SPECTROSCOPY;
ATOMS;
COPPER COMPOUNDS;
CRYSTAL GROWTH FROM MELT;
CRYSTAL ORIENTATION;
DIFFRACTION;
DOPING (ADDITIVES);
SCANNING ELECTRON MICROSCOPY;
STRUCTURAL PROPERTIES;
SULFUR;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
SINGLE CRYSTALS;
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EID: 76049127974
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2009.10.177 Document Type: Article |
Times cited : (10)
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References (25)
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