Structural and optical characterization of Sn incorporation in CuInS 2 thin films grown by vacuum evaporation method

Materials Letters

Volumn 59, Issue 24-25, 2005, Pages 3164-3168

  Rabeh, M Ben ^a   Zribi, M ^a   Kanzari, M ^a   Rezig, B ^a  

^a UNIVERSITY OF TUNIS EL MANAR   (Tunisia)

Author keywords

CuInS2; Doping; Thin films

Indexed keywords

COPPER COMPOUNDS; CRYSTALS; DOPING (ADDITIVES); PHOSPHORUS; POLYCRYSTALLINE MATERIALS; STOICHIOMETRY; TIN; TOXIC MATERIALS; X RAY DIFFRACTION ANALYSIS;

BANDGAP ENERGY; CUINS2; DIFFRACTION SPECTRA; SUBSTRATE TEMPERATURE; THERMAL EVAPORATION METHOD;

THIN FILM CIRCUITS;

EID: 23744510449     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2005.05.045     Document Type: Article

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