Characterization of Sb-doped CuInS2 crystals

Physica Status Solidi Conferences

Volumn , Issue 2, 2003, Pages 759-762

  Komaki, H ^a   Yoshino, K ^a   Akaki, Y ^a,b   Yoneta, M ^c   Ikari, T ^a  

^a UNIVERSITY OF MIYAZAKI   (Japan)

^b MIYAKONOJO NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^c OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; ELECTRIC CONDUCTIVITY; HOT PRESSING; PHOTOLUMINESCENCE; SEMICONDUCTOR DOPING; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS; ELECTRON PROBE MICROANALYSIS; SEMICONDUCTOR GROWTH; X RAY DIFFRACTION;

ELECTRON PROBE MICROANALYSIS (EPMA); SEMICONDUCTOR CRYSTALS; CHALCOPYRITE STRUCTURES; DONOR AND ACCEPTOR; DONOR-ACCEPTOR PAIR EMISSION; GROWTH PRESSURE; P-TYPE CONDUCTIVITY; PHOTOLUMINESCENCE SPECTRUM; SB DOPING;

COPPER COMPOUNDS; CRYSTAL IMPURITIES;

EID: 1242287645     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200306198     Document Type: Conference Paper

References (7)

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