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Volumn 44, Issue 17, 2009, Pages 4743-4749
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Synthesis, elaboration and characterization of the new material CuIn 3S5 thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
CHALCOPYRITE STRUCTURES;
COMPOSITIONAL PROPERTIES;
DIFFERENT SUBSTRATES;
DIRECT REACTIONS;
ENERGY DISPERSIVE X-RAY;
GLASS SUBSTRATES;
HEATED SUBSTRATES;
HIGH-PURITY;
INDIRECT BAND GAP;
LATTICE PARAMETERS;
MORPHOLOGICAL ANALYSIS;
NEW MATERIAL;
OPTICAL MEASUREMENT TECHNIQUES;
POLYCRYSTALLINE;
PREFERRED ORIENTATIONS;
REFLECTION DATA;
ROOM TEMPERATURE;
SUBSTRATE TEMPERATURE;
XRD;
XRD ANALYSIS;
XRD STUDIES;
ATOMIC FORCE MICROSCOPY;
COPPER COMPOUNDS;
ENERGY GAP;
FILM PREPARATION;
GLASS;
OPTICAL DATA PROCESSING;
OPTICAL MICROSCOPY;
OPTICAL PROPERTIES;
POWDERS;
SUBSTRATES;
SULFUR;
THERMAL EVAPORATION;
THIN FILMS;
VACUUM EVAPORATION;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
AMORPHOUS FILMS;
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EID: 67849124002
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-009-3741-z Document Type: Article |
Times cited : (7)
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References (33)
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