Effect of parasitic capacitance on impedance measurement and model extraction

Electroanalysis

Volumn 22, Issue 3, 2010, Pages 351-358

  Zhang, Guoping ^a   Zhu, Rong ^a  

^a Tsinghua University   (China)

Author keywords

Fitting method; I V assisted estimation method; Impedance spectroscopy (IS); Model parameter extraction; Parasitic capacitance

Indexed keywords

CAPACITANCE; ELECTRIC IMPEDANCE MEASUREMENT; EXTRACTION; INTERFACES (MATERIALS); LEAST SQUARES APPROXIMATIONS; PARAMETER ESTIMATION;

ESTIMATION METHODS; FITTING METHOD; I-V ASSISTED ESTIMATION METHOD; IMPEDANCE MEASUREMENT; IMPEDANCE MODELING; IMPEDANCE SPECTROSCOPY; MODEL-PARAMETER EXTRACTION; PARAMETERS EXTRACTION; PARASITICS CAPACITANCE;

PARAMETER EXTRACTION;

EID: 75849117528     PISSN: 10400397     EISSN: 15214109     Source Type: Journal    
DOI: 10.1002/elan.200900324     Document Type: Article

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