Effects of BaO-SiO2 glass particle size on the microstructures and dielectric properties of Mn-doped Ba(Ti, Zr)O3 ceramics

Journal of the European Ceramic Society

Volumn 30, Issue 6, 2010, Pages 1469-1476

  Jain, Ting An ^a   Fung, Kuan Zong ^a   Hsiao, Shawn ^b   Chan, Johnny ^b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b Darfon Electronics Corp   (Taiwan)

Author keywords

BaTiO3; Capacitors; Dielectric properties; Electron microscopy; Grain growth

Indexed keywords

BA(TI ,ZR)O; BATIO3; COMPOSITIONAL DISTRIBUTION; ENERGY DISPERSIVE X-RAY; GLASS FRIT; GLASS PARTICLES; GLASS PHASE; METALLOGRAPHIC OBSERVATIONS; MICROSTRUCTURAL EVALUATION; MN-DOPED; SINTERING BEHAVIORS; TEM;

BARIUM; BARIUM COMPOUNDS; CAPACITANCE; CAPACITORS; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; GLASS; GRAIN SIZE AND SHAPE; MANGANESE; MANGANESE COMPOUNDS; MICROSTRUCTURE; PHASE INTERFACES; SILICON COMPOUNDS; SINTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZIRCONIUM;

GRAIN GROWTH;

EID: 75749154950     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.11.006     Document Type: Article

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