Effect of Mn addition on dc-electrical degradation of multilayer ceramic capacitor with Ni internal electrode

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 11 B, 2002, Pages 6957-6961

  Morita, Koichiro ^a   Mizuno, Youichi ^a   Chazono, Hirokazu ^a   Kishi, Hiroshi ^a  

^a TAIYO YUDEN CO LTD   (Japan)

Author keywords

Degradation; Dielectrics; Grain boundary; Grain growth; Ni MLCC; Nonlinearity coefficients

Indexed keywords

DEGRADATION; DIELECTRIC MATERIALS; GRAIN BOUNDARIES; GRAIN GROWTH; TEMPERATURE MEASUREMENT;

HIGHLY ACCELERATED LIFETIME TESTING (HALT); INTERNAL ELECTRODE; NI-MLCC; NONLINEARITY COEFFICIENTS; TEMPERATURE CHARACTERISTICS (TC);

CERAMIC CAPACITORS;

EID: 11044228597     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.41.6957     Document Type: Article

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