Effect of the A/B ratio on the microstructures and electrical properties of (Ba0.95±xCa0.05)(Ti0.82Zr0.18)O3 for multilayer ceramic capacitors with nickel electrodes

Journal of Alloys and Compounds

Volumn 468, Issue 1-2, 2009, Pages 370-374

  Jain, T A ^a   Fung, K Z ^a   Chan, Johnny ^b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b Darfon Electronics Corp   (Taiwan)

Author keywords

Ferroelectrics; Grain boundaries; Scanning and transmission electron microscopy; X ray diffraction

Indexed keywords

BARIUM; CALCIUM; CAPACITANCE; CAPACITORS; CERAMIC MATERIALS; CRYSTAL GROWTH; DIELECTRIC DEVICES; DIFFRACTION; ELECTRIC EQUIPMENT; ELECTRIC PROPERTIES; ELECTRODES; ELECTROLYTIC CAPACITORS; ELECTRON MICROSCOPES; GRAIN BOUNDARIES; GRAIN GROWTH; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; MULTILAYERS; NICKEL ALLOYS; OXIDE MINERALS; PERMITTIVITY; PEROVSKITE; SCANNING; SINTERING; TESTING; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

A/B RATIOS; CURIE POINTS; ELECTRICAL PERFORMANCES; ELECTRICAL PROPERTIES; FERROELECTRICS; GRAIN SIZES; HIGHER TEMPERATURES; HIGHLY ACCELERATED LIFE TESTS; LIQUID EUTECTICS; MULTILAYER CERAMIC CAPACITORS; NICKEL ELECTRODES; RELIABILITY PERFORMANCES; ROOM TEMPERATURES; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SINTERING BEHAVIORS;

CERAMIC CAPACITORS;

EID: 58049195466     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.01.073     Document Type: Article

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