Dielectric properties of Pb1-xBaxZrO3 thin films with higher barium content

Key Engineering Materials

Volumn 421-422, Issue , 2010, Pages 119-122

  Hao, Xihong ^a,b   Zhai, Jiwei ^a  

^a TONGJI UNIVERSITY   (China)

^b INNER MONGOLIA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Dielectric properties; PBZ films; Structure

Indexed keywords

BARIUM; BARIUM COMPOUNDS; CERAMIC MATERIALS; DIELECTRIC PROPERTIES; DIELECTRIC PROPERTIES OF SOLIDS; LEAD COMPOUNDS; STRUCTURE (COMPOSITION); TEMPERATURE DISTRIBUTION; ZIRCONIUM COMPOUNDS;

DC BIAS; FIGURE OF MERITS; TEMPERATURE COEFFICIENT OF CAPACITANCE; TEMPERATURE DEPENDENCE; TUNABILITIES;

THIN FILMS;

EID: 75749132803     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/KEM.421-422.119     Document Type: Conference Paper

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