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1
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0036911894
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High sensitivity 25 μm microbolometer FPAs
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SPIE, Orlando, Fl, USA
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D. Murphy, M. Ray, R. Wyles, J. Asbrock, N. Lum, J. Wyles, C. Hewitt, A. Kennedy, D. Van Lue, J. Anderson, D. Bradley, R. Chin, T. Kostrzewa, High sensitivity 25 μm microbolometer FPAs, in: Proceeding of the Infrared Detectors and Focal Plane Arrays VII, SPIE vol. 4721, 2002, Orlando, Fl, USA, pp. 99-110.
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Proceeding of the Infrared Detectors and Focal Plane Arrays VII
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Murphy, D.1
Ray, M.2
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Asbrock, J.4
Lum, N.5
Wyles, J.6
Hewitt, C.7
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Van Lue, D.9
Anderson, J.10
Bradley, D.11
Chin, R.12
Kostrzewa, T.13
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2
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0036911581
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DRS U6000 640 × 480 vox uncooled IR focal plane
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SPIE, Orlando, Fl, USA
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P.E. Howard, J.E. Clarke, A.C. Ionescu, C. Li, J.C. Stevens, DRS U6000 640 × 480 vox uncooled IR focal plane, in: Proceeding of the Infrared Detectors and Focal Plane Arrays VII, SPIE vol. 4721, 2002, Orlando, Fl, USA, pp. 48-55.
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Proceeding of the Infrared Detectors and Focal Plane Arrays VII
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Howard, P.E.1
Clarke, J.E.2
Ionescu, A.C.3
Li, C.4
Stevens, J.C.5
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3
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0036916028
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Recent improvements and developments in Uncooled systems at Bae SYSTEMS North America
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SPIE, Orlando, Fl, USA
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B.S. Backer, N. Butler, M. Kohin, M. Gurnee, J.T. Whitwam, T. Breen, Recent improvements and developments in Uncooled systems at Bae SYSTEMS North America, in: Proceeding of the Infrared Detectors and Focal Plane Arrays VII, SPIE vol. 4721, 2002, Orlando, Fl, USA, pp. 83-90.
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Backer, B.S.1
Butler, N.2
Kohin, M.3
Gurnee, M.4
Whitwam, J.T.5
Breen, T.6
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4
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0036907264
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Thin-film ferroelectrics: Breakthrough
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SPIE, Orlando, Fl, USA
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C.M. Hanson, H.R. Beratan, Thin-film ferroelectrics: breakthrough, in: Proceeding of the Infrared Detectors and Focal Plane Arrays VII, SPIE vol. 4721, 2002, Orlando, Fl, USA pp. 91-98.
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Proceeding of the Infrared Detectors and Focal Plane Arrays VII
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Hanson, C.M.1
Beratan, H.R.2
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5
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7544222712
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United State Patent No 5,367,167, November 22
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United State Patent No 5,367,167, November 22, 1994.
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(1994)
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6
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0036916026
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Commercial and custom 160 × 120, 251 × 1 and 512 × 3 pixel bolometric FPAs
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SPIE, Orlando, Fl, USA
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T.D. Pope, H. Jerominek, C. Alain, C. Cayer, B. Tremblay, C. Grenier, P.A. Topart, S. LeClair, F. Picard, C. Larouche, B. Boulager, A. Martel, Y. Desroches, Commercial and custom 160 × 120, 251 × 1 and 512 × 3 pixel bolometric FPAs, in: Proceeding of the Infrared Detectors and Focal Plane Arrays VII, SPIE vol. 4721, 2002, Orlando, Fl, USA, pp. 64-74.
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Proceeding of the Infrared Detectors and Focal Plane Arrays VII
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Pope, T.D.1
Jerominek, H.2
Alain, C.3
Cayer, C.4
Tremblay, B.5
Grenier, C.6
Topart, P.A.7
Leclair, S.8
Picard, F.9
Larouche, C.10
Boulager, B.11
Martel, A.12
Desroches, Y.13
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7
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0032664791
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Amorphous silicon based uncooled microbolometer IRFPA
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SPIE, Orlando, Fl, USA
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C. Vedel, J.L. Martin, J.L. Ouvrier-Buffet, J.L. Tissot, M. Vilain, J.J. Yon, Amorphous silicon based uncooled microbolometer IRFPA, Infrared Technology and Application XXV, SPIE vol. 3698, 1999, Orlando, Fl, USA.
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(1999)
Infrared Technology and Application XXV
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Vedel, C.1
Martin, J.L.2
Ouvrier-Buffet, J.L.3
Tissot, J.L.4
Vilain, M.5
Yon, J.J.6
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8
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0036911631
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Uncooled amorphous silicon technology: High performance and future trends
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Infrared Detectors and Focal Plane Arrays VII
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E. Mottin, A. Bain, J.L. Martin, J.L. Ouvrier-Buffet, J.J. Yon, J.P. Chatard, J.L. Tissot, Uncooled amorphous silicon technology: high performance and future trends, Infrared Detectors and Focal Plane Arrays VII, Proceedings of SPIE vol. 4721, (2002) pp. 56-63.
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Proceedings of SPIE
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Mottin, E.1
Bain, A.2
Martin, J.L.3
Ouvrier-Buffet, J.L.4
Yon, J.J.5
Chatard, J.P.6
Tissot, J.L.7
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9
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4344698979
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Infrared microbolometer sensors and their application in automotive safety
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J. Valldorf, W. Gessner (Eds.)
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J.J. Yon, L. Biancardini, E. Mottin, J.L. Tissot, L. Letellier, Infrared microbolometer sensors and their application in automotive safety, in: Proceeding of AMAA 2003 Conference, J. Valldorf, W. Gessner (Eds.), pp. 137-157.
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Proceeding of AMAA 2003 Conference
, pp. 137-157
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Yon, J.J.1
Biancardini, L.2
Mottin, E.3
Tissot, J.L.4
Letellier, L.5
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10
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0035761583
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Enhanced amorphous silicon technology for 320 × 240 microbolometer arrays with a pitch of 35 μm
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SPIE
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E. Mottin, J.L. Martin, J.L. Ouvrier-Buffet, M. Vilain, A. Bain, J.J. Yon, J.L. Tissot, J.P. Chatard, Enhanced amorphous silicon technology for 320 × 240 microbolometer arrays with a pitch of 35 μm, Infrared Detectors and Focal Plane Arrays VI, SPIE vol. 4369, 2001.
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(2001)
Infrared Detectors and Focal Plane Arrays VI
, vol.4369
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Mottin, E.1
Martin, J.L.2
Ouvrier-Buffet, J.L.3
Vilain, M.4
Bain, A.5
Yon, J.J.6
Tissot, J.L.7
Chatard, J.P.8
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