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Volumn 4369, Issue , 2001, Pages 250-256
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Enhanced amorphous silicon technology for 320×240 microbolometer arrays with a pitch of 35 μm
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Author keywords
Amorphous silicon; Focal plane array; Microbolometer; Packaging
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Indexed keywords
AMORPHOUS SILICON;
CMOS INTEGRATED CIRCUITS;
COST EFFECTIVENESS;
ELECTRONICS PACKAGING;
ELECTROOPTICAL EFFECTS;
PHYSICAL VAPOR DEPOSITION;
POLYIMIDES;
READOUT SYSTEMS;
SIGNAL TO NOISE RATIO;
COST REDUCTION;
FOCAL PLANE ARRAY;
MICROBOLOMETER;
NOISE EQUIVALENT TEMPERATURE DIFFERENCE;
READOUT INTEGRATED CIRCUIT;
BOLOMETERS;
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EID: 0035761583
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.445293 Document Type: Conference Paper |
Times cited : (43)
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References (2)
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