Experimental determination of optical constants of MgF2 and AlF3 thin films in the vacuum ultra-violet wavelength region (60-124 nm), and its application to optical designs

Optics Communications

Volumn 283, Issue 7, 2010, Pages 1351-1358

  Bridou, F ^a   Cuniot Ponsard, M ^a   Desvignes, J M ^a   Richter, M ^b   Kroth, U ^b   Gottwald, A ^b  

^a UNIV PARIS SUD   (France)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX INDICES; EXPERIMENTAL DETERMINATION; INCIDENCE ANGLES; MONOCHROMATIZED SYNCHROTRON RADIATION; MULTI-LAYER MIRRORS; MULTI-LAYERED; NORMAL INCIDENCE; OPTICAL COMPONENTS; OPTICAL DATA; PRIOR MEASUREMENT; SPECTRAL RANGE; TWO-MATERIALS; VACUUM ULTRAVIOLETS; WAVELENGTH REGIONS;

FLUORINE COMPOUNDS; MIRRORS; OPTICAL CONSTANTS; REFLECTION; SUN; THIN FILMS; VACUUM;

OPTICAL FILMS;

EID: 75349112212     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2009.11.062     Document Type: Article

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