Measurement of depolarization ratio and ultimate limit of polarization crosstalk in silica-based waveguides by using a POLCR

Journal of Lightwave Technology

Volumn 16, Issue 4, 1998, Pages 639-645

  Takada, Kazumasa ^a,b   Mitachi, Seiko ^a,b  

^a IEEE   (Japan)

^b NTT CORPORATION   (Japan)

Author keywords

Crosstalk; Optical interferometry; Optical planar waveguide; Optical time domain reflectometry; Polarization; Rayleigh scattering

Indexed keywords

CROSSTALK; ELECTROMAGNETIC WAVE BACKSCATTERING; INTERFEROMETRY; LIGHT POLARIZATION; LIGHT SCATTERING; OPTICAL COMMUNICATION; OPTICAL FIBERS; OPTICAL VARIABLES MEASUREMENT; REFLECTOMETERS; REFRACTIVE INDEX; SEMICONDUCTOR DEVICE MANUFACTURE; SILICA;

DEPOLARIZATION RATIO MEASUREMENT; OPTICAL TIME DOMAIN REFLECTOMETRY; POLARIZATION CROSSTALK; POLARIZATION OPTICAL LOW COHERENCE REFLECTOMETERS (POLCR); TRANSVERSE ELECTRIC (TE) MODES; TRANSVERSE MAGNETIC (TM) MODES;

OPTICAL WAVEGUIDES;

EID: 0032048988     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.664076     Document Type: Article

References (11)

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