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Volumn 6, Issue 5, 2005, Pages 3-13

Simulation-based assessment of batching strategies in a multi-product semiconductor wafer fabrication facility

Author keywords

Batching; Discrete event simulation; Performance assessment; Semiconductor Manufacturing

Indexed keywords

DISCRETE EVENT SIMULATION; MANUFACTURE; SCHEDULING; SEMICONDUCTOR DEVICE MANUFACTURE; WAFER BONDING;

EID: 74549195450     PISSN: 14738031     EISSN: 1473804X     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.