Novel perspectives for the application of total internal reflection microscopy

Optics Express

Volumn 17, Issue 26, 2009, Pages 23975-23985

  Volpe, Giovanni ^a,b   Brettschneider, Thomas ^b   Helden, Laurent ^b   Bechinger, Clemens ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEXATION; GOLD COMPOUNDS; REFRACTIVE INDEX;

APRIORI; BROWNIAN PARTICLES; COLLOIDAL PARTICLE; DATA ANALYSIS; EQUILIBRIUM DISTRIBUTIONS; EVANESCENT ILLUMINATION; EVANESCENT WAVE; EXPERIMENTAL CONDITIONS; GOLD SURFACES; HYDRODYNAMIC INTERACTION; INTERACTION POTENTIALS; MULTIPLE REFLECTIONS; NONINVASIVE TECHNIQUE; PENETRATION DEPTH; TOTAL INTERNAL REFLECTION MICROSCOPY; TRANSPARENT SURFACES; WALL SEPARATIONS;

REFLECTION;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; METHODOLOGY; MICROSCOPY; PHOTOMETRY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; NEPHELOMETRY AND TURBIDIMETRY;

EID: 73949120833     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.023975     Document Type: Article

References (36)

1. J. Walz, "Measuring particle interactions with total internal reflection microscopy," Curr. Opin. Colloid. Interface Sci. 2, 600-606 (1997).
2. D. C. Prieve, "Measurement of colloidal forces with TIRM," Adv. Colloid. Interface Sci. 82, 93-125 (1999).
3. G. Binnig, C. F. Quate, and C. Gerber, "Atomic force microscope," Phys. Rev. Lett. 56, 930-933 (1986).
4. W Ducker, T. Senden, and R. Pashley, "Direct measurement of colloidal forces using an atomic force microscope," Nature 353, 239-241 (1991).
5. L. P. Ghislain and W W Webb, "Scanning-force microscope based on an optical trap," Opt. Lett. 18, 1678-1680 (1993).
6. K.Berg-Sørensen and H. Flyvbjerg, "Power spectrum analysis for optical tweezers," Rev. Sci. Instrum. 75, 594-612 (2004).
7. G. Volpe, G. Volpe, and D. Petrov, "Brownian motion in a nonhomogeneous force field and photonic force microscope," Phys. Rev. E 76, 061118 (2007).
8. S. G. Bike and D. C. Prieve, "Measurements of double-layer repulsion for slightly overlapping counterion clouds," Int. J. Multiphase Flow 16, 727-740 (1990).
9. H. H. von Grünberg, L. Helden, P. Leiderer, and C. Bechinger, "Measurement of surface charge densities on Brownian particles using total internal reflection microscopy," J. Chem. Phys. 114, 10094-10104 (2001).
10. M. A. Bevan and D. C. Prieve, "Direct measurement of retarded van der Waals attraction," Langmuir 15, 79257936 (1999).
11. M. Piech, P. Weronski, X. Wu, and J. Y. WaIz, "Prediction and measurement of the interparticle depletion interaction next to a flat wall," J. Colloid Interface Sci. 247, 327-341 (2002).
12. M. A. Bevan and P. J. Scales, "Solvent quality dependent interactions and phase behavior of polystyrene particles with physisorbed PEO-PPO-PEO," Langmuir 18, 1474-1484 (2002).
13. L. Helden, R. Roth, G. H. Koenderink, P. Leiderer, and C. Bechinger, "Direct measurement of entropie forces induced by rigid rods," Phys. Rev. Lett. 90, 048301 (2003).
14. D. Kleshchanok, R. Tuinier, and P. R. Lang, "Depletion interaction mediated by a polydisperse polymer studied with total internal reflection microscopy," Langmuir 22, 9121-9128 (2006).
15. V. Blickle, D. Babic, and C. Bechinger, "Evanescent light scattering with magnetic colloids," Appl. Phys. Lett. 87, 101102(2005).
16. C. Hertlein, L. Helden, A. Gambassi, S. Dietrich, and C. Bechinger, "Direct measurement of critical Casimir forces," Nature 451, 172-175 (2008).
17. H. Chew, D.-S. Wang, and M. Kerker, "Elastic scattering of evanescent electromagnetic waves," Appl. Opt. 18, 2679-2687 (1979).
18. C. C. Liu, T. Kaiser, S. Lange, and G. Schweiger, "Structural resonances in a dielectric sphere illuminated by an evanescent wave," Opt. Commun. 117, 521-531 (1995).
19. R. Wannemacher, A. Pack, and M. Quinten, "Resonant absorption and scattering in evanescent fields," Appl. Phys. B 68, 225-232 (1999).
20. C. Liu, T. Weigel, and G. Schweiger, "Structural resonances in a dielectric sphere on a dielectric surface illuminated by an evanescent wave," Opt. Commun. 185, 249-261 (2000).
21. L. Helden, E. Eremina, N. Riefler, C. Hertlein, C. Bechinger, Y Eremin, and T. Wriedt, "Single-particle evanescent light scattering simulations for total internal reflection microscopy," Appl. Opt. 45, 7299-7308 (2006).
22. N. Riefler, E. Eremina, C. Hertlein, L. Helden, Y. Eremin, T. Wriedt, and C. Bechinger, "Comparison of T-matrix method with discrete sources method applied for total internal reflection microscopy," J. Quantum Spectr. Rad. Transfer 106, 464-474 (2007).
23. D. C. Prieve and J. Y. WaIz, "Scattering of an evanescent surface wave by a microscopic dielectric sphere," Appl. Opt. 32, 1629-1641 (1993).
24. M. A. Bevan and D. C. Prieve, "Hindered diffusion of colloidal particles very near to a wall: Revisited," J. Chem. Phys. 113, 1228-1236 (2000).
25. J. Y. WaIz and D. C. Prieve, "Prediction and measurement of the optical trapping forces on a dielectric sphere," Langmuir 8, 3073-3082 (1992).
26. O. Marti, H. Bielefeldt, B. Hecht, S. Herminghaus, P. Leiderer, and J. Mlynek, "Near-field optical measurement of the surface plasmon field," Opt. Commun. 96, 225-228 (1993).
27. G. Volpe, R. Quidant, G. Badenes, and D. Petrov, "Surface plasmon radiation forces," Phys. Rev. Lett. 96,238101 (2006).
28. M. Righini, A. S. Zelenina, C Girard, and R. Quidant, "Parallel and selective trapping in a patterned plasmonic landscape," Nat. Phys. 3, 477-480 (2007).
29. M. Righini, G. Volpe, C. Girard, D. Petrov, and R. Quidant, "Surface plasmon optical tweezers: tunable optical manipulation in the femto-newton range," Phys. Rev. Lett. 100, 186804 (2008).
30. A. Ulman, "Formation and structure of self-assembled monolayers," Chem. Rev. 96, 1533-1554 (1996).
31. C. Hertlein, N. Riefler, E. Eremina, T. Wriedt, Y. Eremin, L. Helden, and C. Bechinger, "Experimental verification of an exact evanescent light scattering model for TIRM," Langmuir 24, 1-4 (2008).
32. C. T. McKee, S. C. Clark, J. Y. WaIz, and W A. Ducker, "Relationship between scattered intensity and separation for particles in an evanescent field," Langmuir 21, 5783-5789 (2005).
33. H. Brenner, "The slow motion of a sphere through a viscous fluid towards a plane surface," Chem. Eng. Sci. 16, 242-251 (1961).
34. R. J. Oetama and J. Y Walz, "A new approach for analyzing particle motion near an interface using total internal reflection microscopy," J. Colloid. Interface Sci. 284, 323-331 (2005).
35. M. D. Carbajal-Tinoco, R. Lopez-Fernandez, and J. L. Arauz-Lara, "Asymmetry in colloidal diffusion near a rigid wall," Phys. Rev. Lett. 99, 138303 (2007).
36. G. Volpe, G. Kozyreff, and D. Petrov, "Backscattering position detection for photonic force microscopy," J. Appl. Phys. 102, 084701 (2007).