A new approach for analyzing particle motion near an interface using total internal reflection microscopy

Journal of Colloid and Interface Science

Volumn 284, Issue 1, 2005, Pages 323-331

  Oetama, Ratna J ^a   Walz, John Y ^a  

^a Yale University   (United States)

Author keywords

Brownian motion; Hindered mobility; Total internal reflection microscopy

Indexed keywords

DIFFUSION; ELEMENTARY PARTICLES; MICROSCOPIC EXAMINATION; POTENTIAL ENERGY; REFLECTION; SAMPLING;

DIFFUSION COEFFICIENTS; TOTAL INTERNAL REFLECTION MICROSCOPY (TIRM); VERTICAL DISPLACEMENTS;

COLLOIDS;

ANALYTIC METHOD; ARTICLE; COLLOID; DIFFUSION COEFFICIENT; ENERGY; FORCE; MATHEMATICAL ANALYSIS; MICROSCOPY; MOLECULAR DYNAMICS; PARTICULATE MATTER; PREDICTION; PRIORITY JOURNAL; SAMPLING; TIME; TOTAL INTERNAL REFLECTION MICROSCOPY;

EID: 14744291566     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2004.09.058     Document Type: Article

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