Relationship between scattered intensity and separation for particles in an evanescent field

Langmuir

Volumn 21, Issue 13, 2005, Pages 5783-5789

  McKee, Clayton T ^a,b   Clark, Spencer C ^a   Walz, John Y ^c   Ducker, William A ^a,b  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DECAY LENGTH; EVANESCENT FIELDS; EXPONENTIAL DECAY; SCATTERED INTENSITY;

ATOMIC FORCE MICROSCOPY; ERROR ANALYSIS; GLASS; LIGHT POLARIZATION; LIGHT SCATTERING; POLYSTYRENES; SOLUTIONS;

HIGH ENERGY PHYSICS;

EID: 21644462350     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la046856p     Document Type: Article

References (7)

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6. Ducker, W. A.; Senden, T. J.; Pashley, R. M. Nature 1991, 353, 239-241.
7. Court, N.; von Willisen, F. K. Appl. Opt. 1964, 3, 719726.