Solution assembly of organized carbon nanotube networks for thin-film transistors

ACS Nano

Volumn 3, Issue 12, 2009, Pages 4089-4097

  LeMieux, Melburne C ^a   Sok, Seihout ^a   Roberts, Mark E ^a   Opatkiewicz, Justin P ^a   Liu, Derrick ^a   Barman, Soumendra N ^a   Patil, Nishant ^a   Mitra, Subhasish ^a   Bao, Zhenan ^a  

^a Stanford University   (United States)

Author keywords

Aligned nanotube network; Directed assembly; Thin film transistor

Indexed keywords

ALIGNED NANOTUBES; ALIGNED SINGLE-WALLED CARBON NANOTUBES; APPARENT MOBILITY; AUTONOMOUS SENSORS; CARBON NANOTUBE NETWORK; CONDUCTIVE SHEET; DIRECTED ASSEMBLY; ELECTRONICS MARKETS; FLEXIBLE ELECTRONICS; FUNCTIONALIZED; HYDRODYNAMIC FORCES; LARGE AREA DISPLAY; NANO-MATERIALS; NANOSCALE ASSEMBLIES; NEW DEVICES; ON/OFF RATIO; SEMI-CONDUCTING NANOTUBES; SPIN RATE; SPIN-ASSEMBLY; SUBMONOLAYER FILMS; SURFACE INTERACTIONS; TRANSPARENT ELECTRONICS; ULTRA-THIN;

CARBON FILMS; CARBON NANOTUBES; CONDUCTIVE MATERIALS; ELECTRONIC PROPERTIES; FLEXIBLE DISPLAYS; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPIN DYNAMICS; STEREOCHEMISTRY; TOPOLOGY;

THIN FILM TRANSISTORS;

NANOTUBE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTOR; SOLUTION AND SOLUBILITY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MICROELECTRODES; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES; PARTICLE SIZE; SOLUTIONS; SURFACE PROPERTIES; TRANSISTORS, ELECTRONIC;

EID: 73849133633     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn900827v     Document Type: Article

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