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Journal of Applied Physics

Volumn 106, Issue 12, 2009, Pages

Thermal strain measurement in sol-gel lead zirconate titanate thin films

(4) Berfield, T A a Carroll III, J F b Payne, D A c Sottos, N R c

a University of Louisville (United States)

b SANDIA NATIONAL LABORATORIES (United States)

c University of Illinois at Urbana Champaign (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLANKET FILMS; DIGITAL IMAGE CORRELATIONS; IN-PLANE STRAINS; IN-PLANE STRESS; LEAD ZIRCONATE TITANATE THIN FILMS; LINE FEATURES; OCTADECYLTRICHLOROSILANE; PLATINIZED SILICON SUBSTRATES; STRAIN RESULTS; THERMAL STRAIN; WAFER CURVATURE MEASUREMENT;

GELS; INFORMATION SCIENCE; MONOLAYERS; SEMICONDUCTING LEAD COMPOUNDS; SILICON WAFERS; SOL-GEL PROCESS; SOL-GELS; SOLS; STRAIN MEASUREMENT; THIN FILMS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 73849087894 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3251420 Document Type: Article

Times cited : (13)

References (28)

1
- 30244503504
- 0021-8979. 10.1063/1.351726
- M. Klee, R. Eusemann, W. Brand, and H. van Hal, J. Appl. Phys. 0021-8979 72, 1566 (1992). 10.1063/1.351726
- (1992) J. Appl. Phys. , vol.72 , pp. 1566
- Klee, M.¹ Eusemann, R.² Brand, W.³ Van Hal, H.⁴

2
- 0032613385
- 0021-8979. 10.1063/1.369362
- Z. Huang, Q. Zhang, and R. W. Whatmore, J. Appl. Phys. 0021-8979 85, 7355 (1999). 10.1063/1.369362
- (1999) J. Appl. Phys. , vol.85 , pp. 7355
- Huang, Z.¹ Zhang, Q.² Whatmore, R.W.³

3
- 0037048565
- 1359-6454. 10.1016/S1359-6454(02)00254-9
- M. -H. Zhao, R. Fu, D. Lu, and T. -Y. Zhang, Acta Mater. 1359-6454 50, 4241 (2002). 10.1016/S1359-6454(02)00254-9
- (2002) Acta Mater. , vol.50 , pp. 4241
- Zhao, M.-H.¹ Fu, R.² Lu, D.³ Zhang, T.-Y.⁴

4
- 33847707344
- Residual stress effects on piezoelectric response of sol-gel derived lead zirconate titanate thin films
- DOI 10.1063/1.2422778
- T. A. Berfield, R. J. Ong, D. A. Payne, and N. R. Sottos, J. Appl. Phys. 0021-8979 101, 024102 (2007). 10.1063/1.2422778 (Pubitemid 46372824)
- (2007) Journal of Applied Physics , vol.101 , Issue.2 , pp. 024102
- Berfield, T.A.¹ Ong, R.J.² Payne, D.A.³ Sottos, N.R.⁴

5
- 85044228491
- unpublished
- B. A. Tuttle, J. A. Voight, T. J. Garino, D. C. Goodnow, R. W. Schwartz, D. L. Lamppa, T. J. Headley, and M. O. Eatough, Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics, 1992 (unpublished), p. 344.
- (1992) Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics , pp. 344
- Tuttle, B.A.¹ Voight, J.A.² Garino, T.J.³ Goodnow, D.C.⁴ Schwartz, R.W.⁵ Lamppa, D.L.⁶ Headley, T.J.⁷ Eatough, M.O.⁸

6
- 0003797161
- unpublished
- B. A. Tuttle, T. J. Garino, J. A. Voight, T. J. Headley, D. Dimos, and M. O. Eatough, Proceeding of NATO Advanced Research Workshop on Science and Technology of Electroceramic Thin Films, 1995 (unpublished), p. 117.
- (1995) Proceeding of NATO Advanced Research Workshoon Science and Technology of Electroceramic Thin Films , pp. 117
- Tuttle, B.A.¹ Garino, T.J.² Voight, J.A.³ Headley, T.J.⁴ Dimos, D.⁵ Eatough, M.O.⁶

7
- 34247476727
- 3 films fabricated by sol-gel process
- DOI 10.1007/s10971-007-0761-5, Special Issue on Sol-Gel and Solution-Derived Ferroelectric Materials
- J. -W. Lee, S. -M. Lee, C. -S. Park, G. -T. Park, and H. -E. Kim, J. Sol-Gel Sci. Technol. 0928-0707 42, 305 (2007). 10.1007/s10971-007-0761-5 (Pubitemid 46646899)
- (2007) Journal of Sol-Gel Science and Technology , vol.42 , Issue.3 , pp. 305-308
- Lee, J.-W.¹ Lee, S.-M.² Park, C.-S.³ Park, G.-T.⁴ Kim, H.-E.⁵

8
- 0031250156
- 0021-8979. 10.1063/1.365663
- J. Lappalainen, J. Franti, and V. Lantto, J. Appl. Phys. 0021-8979 82, 3469 (1997). 10.1063/1.365663
- (1997) J. Appl. Phys. , vol.82 , pp. 3469
- Lappalainen, J.¹ Franti, J.² Lantto, V.³

9
- 0022796159
- 0022-3093. 10.1016/S0022-3093(86)80079-5
- G. Scherer, J. Non-Cryst. Solids 0022-3093 87, 199 (1986). 10.1016/S0022-3093(86)80079-5
- (1986) J. Non-Cryst. Solids , vol.87 , pp. 199
- Scherer, G.¹

10
- 0029358255
- 0884-2914. 10.1557/JMR.1995.2042
- C. D. E. Lakeman, Z. Xu, and D. A. Payne, J. Mater. Res. 0884-2914 10, 2042 (1995). 10.1557/JMR.1995.2042
- (1995) J. Mater. Res. , vol.10 , pp. 2042
- Lakeman, C.D.E.¹ Xu, Z.² Payne, D.A.³

11
- 29144437809
- 0884-2914. 10.1557/jmr.2005.0313
- Y. Xiang, X. Chen, and J. J. Vlassak, J. Mater. Res. 0884-2914 20, 2360 (2005). 10.1557/jmr.2005.0313
- (2005) J. Mater. Res. , vol.20 , pp. 2360
- Xiang, Y.¹ Chen, X.² Vlassak, J.J.³

12
- 19944382508
- A tensile-testing technique for micrometer-sized free-standing thin films
- DOI 10.1016/j.tsf.2005.03.030, PII S0040609005003287
- Y. -W. Cheng, D. T. Read, J. D. McColskey, and J. E. Wright, Thin Solid Films 0040-6090 484, 426 (2005). 10.1016/j.tsf.2005.03.030 (Pubitemid 40751932)
- (2005) Thin Solid Films , vol.484 , Issue.1-2 , pp. 426-432
- Cheng, Y.-W.¹ Read, D.T.² McColskey, J.D.³ Wright, J.E.⁴

13
- 49349116985
- 0040-6090. 10.1016/j.tsf.2008.03.018
- M. Zhao, Y. Xiang, J. Xu, N. Ogasawara, N. Chiba, and X. Chen, Thin Solid Films 0040-6090 516, 7571 (2008). 10.1016/j.tsf.2008.03.018
- (2008) Thin Solid Films , vol.516 , pp. 7571
- Zhao, M.¹ Xiang, Y.² Xu, J.³ Ogasawara, N.⁴ Chiba, N.⁵ Chen, X.⁶

14
- 0022223880
- 0268-4373
- K. D. Budd, S. K. Dey, and D. A. Payne, Br. Ceram. Proc. 0268-4373 36, 107 (1985).
- (1985) Br. Ceram. Proc. , vol.36 , pp. 107
- Budd, K.D.¹ Dey, S.K.² Payne, D.A.³

15
- 84985108261
- 0002-7820. 10.1111/j.1151-2916.1992.tb04392.x
- C. D. E. Lakeman and D. A. Payne, J. Am. Ceram. Soc. 0002-7820 75, 3091 (1992). 10.1111/j.1151-2916.1992.tb04392.x
- (1992) J. Am. Ceram. Soc. , vol.75 , pp. 3091
- Lakeman, C.D.E.¹ Payne, D.A.²

16
- 0031551391
- 0935-9648. 10.1002/adma.19970091107
- N. L. Jeon, P. Clem, D. Y. Jung, W. Lin, G. S. Girolami, D. A. Payne, and R. G. Nuzzo, Adv. Mater. (Weinheim, Ger.) 0935-9648 9, 891 (1997). 10.1002/adma.19970091107
- (1997) Adv. Mater. (Weinheim, Ger.) , vol.9 , pp. 891
- Jeon, N.L.¹ Clem, P.² Jung, D.Y.³ Lin, W.⁴ Girolami, G.S.⁵ Payne, D.A.⁶ Nuzzo, R.G.⁷

17
- 0032682741
- 1385-3449. 10.1023/A:1009947211056
- D. A. Payne and P. G. Clem, J. Electroceram. 1385-3449 3, 163 (1999). 10.1023/A:1009947211056
- (1999) J. Electroceram. , vol.3 , pp. 163
- Payne, D.A.¹ Clem, P.G.²

18
- 0036856525
- Chemical solution processing and patterning with additive deposition of functional ceramics on planar and nonplanar surfaces
- DOI 10.1016/S0167-2738(02)00607-0, PII S0167273802006070
- E. A. Mikalsen and D. A. Payne, Solid State Ionics 0167-2738 151, 53 (2002). 10.1016/S0167-2738(02)00607-0 (Pubitemid 35411697)
- (2002) Solid State Ionics , vol.151 , Issue.1-4 , pp. 53-60
- Mikalsen, E.A.¹ Payne, D.A.²

19
- 33645664998
- 1613-6810. 10.1002/smll.200500289
- T. A. Berfield, J. K. Patel, R. G. Shimmin, P. V. Braun, J. Lambros, and N. R. Sottos, Small 1613-6810 2, 631 (2006). 10.1002/smll.200500289
- (2006) Small , vol.2 , pp. 631
- Berfield, T.A.¹ Patel, J.K.² Shimmin, R.G.³ Braun, P.V.⁴ Lambros, J.⁵ Sottos, N.R.⁶

20
- 33947394769
- Micro-and nanoscale deformation measurement of surface and internal planes via digital image correlation
- DOI 10.1007/s11340-006-0531-2
- T. A. Berfield, J. K. Patel, R. G. Shimmin, P. V. Braun, J. Lambros, and N. R. Sottos, Exp. Mech. 0014-4851 47, 51 (2007). 10.1007/s11340-006-0531-2 (Pubitemid 46454761)
- (2007) Experimental Mechanics , vol.47 , Issue.1 , pp. 51-62
- Berfield, T.A.¹ Patel, J.K.² Shimmin, R.G.³ Braun, P.V.⁴ Lambros, J.⁵ Sottos, N.R.⁶

21
- 0020130132
- 0091-3286
- W. H. Peters and W. F. Ranson, Opt. Eng. (Bellingham) 0091-3286 21, 427 (1982).
- (1982) Opt. Eng. (Bellingham) , vol.21 , pp. 427
- Peters, W.H.¹ Ranson, W.F.²

22
- 0020846701
- 0091-3286
- W. H. Peters, W. F. Ranson, M. A. Sutton, T. C. Chu, and J. Anderson, Opt. Eng. (Bellingham) 0091-3286 22, 738 (1983).
- (1983) Opt. Eng. (Bellingham) , vol.22 , pp. 738
- Peters, W.H.¹ Ranson, W.F.² Sutton, M.A.³ Chu, T.C.⁴ Anderson, J.⁵

23
- 0024733952
- 0014-4851. 10.1007/BF02321405
- H. A. Bruck, S. R. McNeill, M. A. Sutton, and W. H. Peters, Exp. Mech. 0014-4851 29, 261 (1989). 10.1007/BF02321405
- (1989) Exp. Mech. , vol.29 , pp. 261
- Bruck, H.A.¹ McNeill, S.R.² Sutton, M.A.³ Peters, W.H.⁴

24
- 24144475220
- 0014-4851. 10.1007/BF02428187
- J. L. Abanto-Bueno and J. Lambros, Exp. Mech. 0014-4851 45, 144 (2005). 10.1007/BF02428187
- (2005) Exp. Mech. , vol.45 , pp. 144
- Abanto-Bueno, J.L.¹ Lambros, J.²

25
- 0026962546
- 0743-7463. 10.1021/la00048a013
- A. van Blaaderen and A. Vrij, Langmuir 0743-7463 8, 2921 (1992). 10.1021/la00048a013
- (1992) Langmuir , vol.8 , pp. 2921
- Blaaderen, A.V.¹ Vrij, A.²

26
- 0002854161
- 0743-7463. 10.1021/la00017a019
- N. A. M. Verhaegh and A. van Blaaderen, Langmuir 0743-7463 10, 1427 (1994). 10.1021/la00017a019
- (1994) Langmuir , vol.10 , pp. 1427
- Verhaegh, N.A.M.¹ Blaaderen, A.V.²

27
- 0000073841
- 0950-1207. 10.1098/rspa.1909.0021
- G. G. Stoney, Proc. R. Soc. London, Ser. A 0950-1207 82, 172 (1909). 10.1098/rspa.1909.0021
- (1909) Proc. R. Soc. London, Ser. A , vol.82 , pp. 172
- Stoney, G.G.¹

28
- 0001106749
- 0021-8979. 10.1063/1.360288
- I. -S. Yeo, P. S. Ho, and S. G. H. Anderson, J. Appl. Phys. 0021-8979 78, 945 (1995). 10.1063/1.360288
- (1995) J. Appl. Phys. , vol.78 , pp. 945
- Yeo, I.-S.¹ Ho, P.S.² Anderson, S.G.H.³

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