Nanoscale characterization and local piezoelectric properties of lead-free KNN-LT-LS thin films

Journal of Physics D: Applied Physics

Volumn 43, Issue 2, 2010, Pages

  Abazari, M ^a   Choi, T ^b   Cheong, S W ^b   Safari, A ^a  

^a The State University of New Jersey   (United States)

^b RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISPLACEMENT CURVE; DOMAIN STRUCTURE; FERROELECTRIC DOMAIN STRUCTURE; FUTURE APPLICATIONS; LEAD-FREE; LEAD-FREE THIN FILM; MN-DOPED; NANOSCALE CHARACTERIZATION; PIEZOELECTRIC COEFFICIENT; PIEZOELECTRIC PROPERTY; PIEZORESPONSE FORCE MICROSCOPY; PZT THIN FILM; RELATIVE PERMITTIVITY; SRTIO; TETRAGONAL STRUCTURE;

CRYSTALS; DIFFRACTION; EPITAXIAL FILMS; FERROELECTRICITY; HOLOGRAPHIC INTERFEROMETRY; MANGANESE; MANGANESE COMPOUNDS; PERMITTIVITY MEASUREMENT; PIEZOELECTRICITY; SODIUM; TANTALUM;

FERROELECTRIC FILMS;

EID: 73649144568     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/2/025405     Document Type: Article

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