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Volumn 94, Issue 9, 2009, Pages

Ferroelectric and piezoelectric properties of Na0.52K 0.48NbO3 thin films prepared by radio frequency magnetron sputtering

(5) Lee, Hai Joon a Kim, Ill Won a Kim, Jin Soo b Ahn, Chang Won c Park, Bae Ho d

a University of Ulsan (South Korea)

b Pukyong National University (South Korea)

c Korea Basic Science Institute (KBSI) (South Korea)

d Konkuk University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; FERROELECTRICITY; MAGNETRONS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; RADIO; RADIO WAVES; SEMICONDUCTING SILICON COMPOUNDS; SILICON COMPOUNDS; SODIUM; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ATOMIC FORCES; COERCIVE ELECTRIC FIELDS; DIELECTRIC DISPERSIONS; FERROELECTRIC AND PIEZOELECTRIC PROPERTIES; GRAIN MORPHOLOGIES; LEAKAGE CURRENT DENSITIES; LOW FREQUENCIES; PIEZOELECTRIC CONSTANTS; PIEZOELECTRIC FORCE MICROSCOPIES; RADIO FREQUENCY MAGNETRON SPUTTERING; RADIO FREQUENCY MAGNETRON SPUTTERING METHODS; REMNANT POLARIZATIONS; SI SUBSTRATES; SINGLE PHASE; TEMPERATURE RANGES; X- RAY DIFFRACTIONS;

FILM PREPARATION;

EID: 62149084043 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3095500 Document Type: Article

Times cited : (76)

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