An original apparatus for endurance testing of MEMS electrical contact materials

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 2009, Pages 285-289

  Vincent, Maxime ^a,b   Chiesi, Laurent ^a   Rousset, Patrick ^a   Lapiere, Christophe ^a   Poulain, Christophe ^b   Carbone, Laurent ^a   Houzé, Frédéric ^c   Delamare, Jérôme ^c  

^a Schneider Electric Industries   (France)

^b CEA LETI   (France)

^c CNRS   (France)

Author keywords

Contact material; Contact resistance; Electrical contact; Endurance test; Lifetime evaluation; MEMS switch

Indexed keywords

CONTACT MATERIAL; ELECTRICAL CONTACTS; ENDURANCE TEST; LIFETIME EVALUATION; MEMS SWITCHES;

CONTACT RESISTANCE; DEGRADATION; DURABILITY; ELECTRIC SWITCHES; MATERIALS; MATERIALS TESTING; MEMS; MICROELECTROMECHANICAL DEVICES; TESTING; VACUUM APPLICATIONS;

ELECTRIC CONTACTS;

EID: 73649099150     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HOLM.2009.5284386     Document Type: Conference Paper

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