-
1
-
-
73149087426
-
A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors
-
Lang H.P., Berger R., Battiston F., Ramseyer J.-P., Meyer E., Andreoli C., Brugger J., Vettiger P., Despont M., Mezzacasa T., Scandella L., Güntherodt H.-J., Gerber Ch., and Gimzewski J.K. A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied Physics A 66 7 (1998) S61-S64
-
(1998)
Applied Physics A
, vol.66
, Issue.7
-
-
Lang, H.P.1
Berger, R.2
Battiston, F.3
Ramseyer, J.-P.4
Meyer, E.5
Andreoli, C.6
Brugger, J.7
Vettiger, P.8
Despont, M.9
Mezzacasa, T.10
Scandella, L.11
Güntherodt, H.-J.12
Gerber, Ch.13
Gimzewski, J.K.14
-
3
-
-
3342996931
-
Atomic force microscope probe based controlled pushing for nanotribological characterization
-
Sitti M. Atomic force microscope probe based controlled pushing for nanotribological characterization. IEEE/ASME Transactions on Mechatronics 9 2 (2004) 343-349
-
(2004)
IEEE/ASME Transactions on Mechatronics
, vol.9
, Issue.2
, pp. 343-349
-
-
Sitti, M.1
-
5
-
-
0034205494
-
Controlled pushing of nanoparticles: modeling and experiments
-
Sitti M. Controlled pushing of nanoparticles: modeling and experiments. IEEE/ASME Transactions on Mechatronics 5 (2000) 199-211
-
(2000)
IEEE/ASME Transactions on Mechatronics
, vol.5
, pp. 199-211
-
-
Sitti, M.1
-
6
-
-
84949233862
-
Survey of nanomanipulation systems
-
Maui, USA, November
-
M. Sitti, Survey of nanomanipulation systems, Proceedings of the IEEE Nanotechnology Conference, pp.75-80, Maui, USA, November 2001.
-
(2001)
Proceedings of the IEEE Nanotechnology Conference
, pp. 75-80
-
-
Sitti, M.1
-
7
-
-
0032516950
-
Manipulation of Ag nanoparticles utilizing atomic force microscopy
-
Martin M., Roschier M., Hakonen P., Parts U., and Paalanen M. Manipulation of Ag nanoparticles utilizing atomic force microscopy. Applied Physics Letters vol.3 (1998) 1505-1507
-
(1998)
Applied Physics Letters
, vol.3
, pp. 1505-1507
-
-
Martin, M.1
Roschier, M.2
Hakonen, P.3
Parts, U.4
Paalanen, M.5
-
8
-
-
50249188417
-
A programmable AFM-based nanomanipulation method using vibration-mode operation
-
China
-
Y. Yang, Z. Dong, Y. Qu, M. Li, W.J. Li, January 2008. A programmable AFM-based nanomanipulation method using vibration-mode operation. in: Proceeding of the 3rd IEEE International Conference on Nano/Micro Engineering and Molecular Systems, China, 681-685.
-
(2008)
Proceeding of the 3rd IEEE International Conference on Nano/Micro Engineering and Molecular Systems
, pp. 681-685
-
-
Yang, Y.1
Dong, Z.2
Qu, Y.3
Li, M.4
Li, W.J.5
January6
-
9
-
-
34249022469
-
Controlled manipulation of nanoparticles with an atomic force microscope
-
Junno T., Deppert K., Montelius L., and Samuelson M. Controlled manipulation of nanoparticles with an atomic force microscope. Applied Physics Letters 66 26 (1995) 3627-3629
-
(1995)
Applied Physics Letters
, vol.66
, Issue.26
, pp. 3627-3629
-
-
Junno, T.1
Deppert, K.2
Montelius, L.3
Samuelson, M.4
-
10
-
-
73549087892
-
Atomic force microscope based two-dimensional assembly of micro
-
Tafazolli A., Pwasha C., and Sitti M. Atomic force microscope based two-dimensional assembly of micro. IEEE 0-7803-9080-6/05 (2005)
-
(2005)
IEEE
, vol.7803 -9080-6-05
-
-
Tafazolli, A.1
Pwasha, C.2
Sitti, M.3
-
12
-
-
0037101427
-
Unifying theory of tapping mode atomic force microscopy
-
San Paulo A., and Garcia R. Unifying theory of tapping mode atomic force microscopy. Physical Review B vol. 66 (2002) 041406R
-
(2002)
Physical Review B
, vol.66
-
-
San Paulo, A.1
Garcia, R.2
-
13
-
-
0000872987
-
Dynamics of vibrating tip near or in intermittent contact with a surface
-
Garcia R., and San Paulo A. Dynamics of vibrating tip near or in intermittent contact with a surface. Physical Review B vol. 61 (2000) 13381-13384
-
(2000)
Physical Review B
, vol.61
, pp. 13381-13384
-
-
Garcia, R.1
San Paulo, A.2
-
14
-
-
0000583552
-
Attractive and repulsive tip-sample interaction regimes in tapping mode atomic force microscopy
-
Garcia R., and San Paulo A. Attractive and repulsive tip-sample interaction regimes in tapping mode atomic force microscopy. Physical Review B 60 (1999) 4961-4967
-
(1999)
Physical Review B
, vol.60
, pp. 4961-4967
-
-
Garcia, R.1
San Paulo, A.2
-
15
-
-
3142715718
-
A fresh insight into the microcantilever-sample interaction problem in non-contact atomic force microscopy
-
Jalili N., Dadfarnia M., and Dawson D.M. A fresh insight into the microcantilever-sample interaction problem in non-contact atomic force microscopy. ASME Journal of Dynamic Systems, Measurements and Control 126 2 (2004) 327-335
-
(2004)
ASME Journal of Dynamic Systems, Measurements and Control
, vol.126
, Issue.2
, pp. 327-335
-
-
Jalili, N.1
Dadfarnia, M.2
Dawson, D.M.3
-
16
-
-
34249899915
-
Nonlinear vibrations and frequency response analysis of piezoelectrically driven microcantilevers
-
Mahmoodi S.N., and Jalili N. Nonlinear vibrations and frequency response analysis of piezoelectrically driven microcantilevers. International Journal of Nonlinear Mechanics 42 (2007) 577-587
-
(2007)
International Journal of Nonlinear Mechanics
, vol.42
, pp. 577-587
-
-
Mahmoodi, S.N.1
Jalili, N.2
-
20
-
-
84949232840
-
Manipulation of nanoscale components with the AFM: Principles and applications
-
USA
-
A.A.G. Riquicha, S. Meltzer, F.P. Teran Arce, J.H. Makaliwe, 2001. Manipulation of nanoscale components with the AFM: principles and applications, in: Proceeding of the 1st IEEE Nanotechnology, USA.
-
(2001)
Proceeding of the 1st IEEE Nanotechnology
-
-
Riquicha, A.A.G.1
Meltzer, S.2
Teran Arce, F.P.3
Makaliwe, J.H.4
|