Structural characterization of Zn1-xCdxO (0≤x≤0.20) microrods grown by spray pyrolysis

Materials Science in Semiconductor Processing

Volumn 12, Issue 3, 2009, Pages 118-121

  Bacaksiz, E ^a   Altunbas M ^a   Ozcelik S ^b   Oltulu, O ^c   Tomakin, M ^d   Yilmaz, S ^a  

^a KARADENIZ TECHNICAL UNIVERSITY   (Turkey)

^b GAZI UNIVERSITY   (Turkey)

^c HARRAN UNIVERSITY   (Turkey)

^d RECEP TAYYIP ERDOGAN UNIVERSITY   (Turkey)

Author keywords

Microrods; Optical properties; Zinc oxide

Indexed keywords

BAND GAPS; CRYSTALLOGRAPHIC PHASE; DIRECT MODULATION; DOPED ZNO; EMISSION BANDS; FUNDAMENTAL BAND GAP; MICRORODS; OPTICAL MEASUREMENT; PREFERRED ORIENTATIONS; SEM; STRUCTURAL CHARACTERIZATION; UV LUMINESCENCE; VISIBLE EMISSIONS; WURTZITES; XRD; ZNO FILMS;

DOPING (ADDITIVES); ENERGY GAP; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; ZINC; ZINC OXIDE; ZINC SULFIDE;

SPRAY PYROLYSIS;

EID: 73049115610     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2009.09.001     Document Type: Article

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