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Volumn 73, Issue 5, 2009, Pages 927-938

Stacking faults and microstructural parameters in non-mulberry silk fibres

Author keywords

Crystallite size; Fibres; Stacking

Indexed keywords

LINE PROFILES; MICROSTRUCTURAL PARAMETERS; NON-MULBERRY SILK; SILK FIBRES; WHOLE-PATTERN FITTING; X RAY REFLECTION;

EID: 72849136180     PISSN: 03044289     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12043-009-0159-8     Document Type: Article
Times cited : (18)

References (32)
  • 1
    • 4043108748 scopus 로고    scopus 로고
    • E J Mittemeijer and P Scardi (Eds), (Springer Verlag, Berlin, Heidelberg)
    • E J Mittemeijer and P Scardi (Eds), Diffraction analysis of the microstructure of materials (Springer Verlag, Berlin, Heidelberg, 2003).
    • (2003) Diffraction Analysis of the Microstructure of Materials
  • 2
    • 0004086684 scopus 로고    scopus 로고
    • R L Snyder, J Fiala and H J Bunge (Eds), (Oxford University Press)
    • R L Snyder, J Fiala and H J Bunge (Eds), Defect and microstructure analysis by diffraction (Oxford University Press, 1999).
    • (1999) Defect and Microstructure Analysis by Diffraction
  • 22
    • 0004161838 scopus 로고
    • W Press, B P Flannery, S Teukolsky and Vetterling (Eds), (Cambridge University Press)
    • W Press, B P Flannery, S Teukolsky and Vetterling (Eds), Numerical recipes (Cambridge University Press, 1986).
    • (1986) Numerical Recipes


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.