Effect of surface treatments on the electrical and optical properties of CdZnTe single crystal

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 566, Issue 2, 2006, Pages 495-499

  Zha, Gangqiang ^a   Jie, Wanqi ^a   Tan, Tingting ^a   Wang, Xiaoqin ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

CdZnTe; IR transmittance; Leakage current; PL; Surface trap state

Indexed keywords

LEAKAGE CURRENTS; PASSIVATION; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM COMPOUNDS; SURFACE ROUGHNESS; SURFACE TREATMENT;

CDZNTE; IR TRANSMITTANCE; SURFACE TRAP STATE;

SINGLE CRYSTALS;

EID: 33748785729     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.06.033     Document Type: Article

References (13)

1. Sen S., and Stannard J.E. Prog. Cryst. Growth Charact. Mater. 28 (1994) 253
2. Limousin O. Nucl. Instr. and Meth. A 504 (2003) 113
3. Koyama A., Hichiwa A., and Hirano R. J. Electron. Mater. 28 (1999) 683
4. Prettyman T.H., Hoffbauer M.A., Rennie J., Cook S., Gregory J., George M., Luke P.N., Amman M., Soldner S., and Earnhart J. Nucl. Instr. and Meth. A 422 (1999) 179
5. Li Q., and Jie W.Q. Semicond. Sci. Technol. 21 (2006) 72
6. Stahle C.M., Shi Z.Q., Hu K., Barthelmy S.D., Snodgrass S.J., Bartlett L.M., Shu P.K., Letonen S.J., and Mach K.J. Proc. SPIE 3115 (1997) 90
7. Mescher M.J., Hoburg J.F., Schlesinger T.E., and James R.B. IEEE Trans. Nucl. Sci. NS-46 (1999) 2289
8. Rybka A.V., Leonov S.A., Prokhoretz I.M., Abyzov A.S., Davydov L.N., Kutny V.E., Rowland M.S., and Smith C.F. Nucl. Instr. and meth. A 458 (2001) 248
9. Wang X.Q., Jie W.Q., Li Q., and Gu Z. Mater. Sci. Semi. Proc. 8 (2005) 615
10. Montgomery H.C. Solid State Electron. 7 (1964) 147
11. Lee J., Giles N.C., Rajavel D., and Summers C.J. J. Appl. Phys. 78 (1995) 5669
12. Kim Y.-H., An S.-Y., Lee J.-Y., Kim I.J., Oh K.-N., Kim S.-U., Park M.-J., and Lee T.-S. J. Appl. Phys. 85 (1999) 7370
13. Hu B., Yin A., Karczewski G., Luo H., Short S.W., Samarth N., Dobrowolska M., and Furdyna J.K. Appl. Phys. 74 (1993) 4153